Condition monitoring of rotating machinery using higher-order spectral slices

Guotong Zhou, Seppo Rantala, Georgios Giannakis

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

Original language	English
Title of host publication	Proceedings of IEEE-SP Workshop on Higher-order Statistics (HOS'95)
Place of Publication	Spain
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	129-133
Publication status	Published - 1995
MoE publication type	B3 Non-refereed article in conference proceedings
Event	IEEE-SP Workshop on Higher-order Statistics, HOS '95 - Girona, Spain Duration: 12 Jun 1995 → 14 Jun 1995

Conference	IEEE-SP Workshop on Higher-order Statistics, HOS '95
Country/Territory	Spain
City	Girona
Period	12/06/95 → 14/06/95

Cite this

@inproceedings{bdbd1d6317154450b057d87dee109202,

title = "Condition monitoring of rotating machinery using higher-order spectral slices",

author = "Guotong Zhou and Seppo Rantala and Georgios Giannakis",

year = "1995",

language = "English",

pages = "129--133",

booktitle = "Proceedings of IEEE-SP Workshop on Higher-order Statistics (HOS'95)",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "IEEE-SP Workshop on Higher-order Statistics, HOS '95 ; Conference date: 12-06-1995 Through 14-06-1995",

}

Condition monitoring of rotating machinery using higher-order spectral slices. / Zhou, Guotong; Rantala, Seppo; Giannakis, Georgios.
Proceedings of IEEE-SP Workshop on Higher-order Statistics (HOS'95). Spain: IEEE Institute of Electrical and Electronic Engineers, 1995. p. 129-133.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

TY - GEN

T1 - Condition monitoring of rotating machinery using higher-order spectral slices

AU - Zhou, Guotong

AU - Rantala, Seppo

AU - Giannakis, Georgios

PY - 1995

Y1 - 1995

M3 - Conference article in proceedings

SP - 129

EP - 133

BT - Proceedings of IEEE-SP Workshop on Higher-order Statistics (HOS'95)

PB - IEEE Institute of Electrical and Electronic Engineers

CY - Spain

T2 - IEEE-SP Workshop on Higher-order Statistics, HOS '95

Y2 - 12 June 1995 through 14 June 1995

ER -