| Original language | English |
|---|---|
| Pages (from-to) | 193-202 |
| Journal | Materials Science Forum |
| Volume | 289-292 |
| DOIs | |
| Publication status | Published - 1998 |
| MoE publication type | A4 Article in a conference publication |
| Event | International Symposium on Electrochemical Methods in Corrosion Research - EMCR 97 - Trento, Italy Duration: 25 Aug 1997 → 29 Aug 1997 |
Cite this
Saario, T., Laitinen, T., & Piippo, J. (1998). Contact electric resistance (CER) technique for In-Situ characterisation of surface films. Materials Science Forum, 289-292, 193-202. https://doi.org/10.4028/www.scientific.net/MSF.289-292.193
@article{f829a154dd5348dcb7e2ec9d8565f3f2,
title = "Contact electric resistance (CER) technique for In-Situ characterisation of surface films",
author = "Timo Saario and Timo Laitinen and Juha Piippo",
year = "1998",
doi = "10.4028/www.scientific.net/MSF.289-292.193",
language = "English",
volume = "289-292",
pages = "193--202",
journal = "Materials Science Forum",
issn = "0255-5476",
}
Saario, T, Laitinen, T & Piippo, J 1998, 'Contact electric resistance (CER) technique for In-Situ characterisation of surface films', Materials Science Forum, vol. 289-292, pp. 193-202. https://doi.org/10.4028/www.scientific.net/MSF.289-292.193
Contact electric resistance (CER) technique for In-Situ characterisation of surface films. / Saario, Timo; Laitinen, Timo; Piippo, Juha.
In: Materials Science Forum, Vol. 289-292, 1998, p. 193-202.Research output: Contribution to journal › Article in a proceedings journal › Scientific › peer-review
TY - JOUR
T1 - Contact electric resistance (CER) technique for In-Situ characterisation of surface films
AU - Saario, Timo
AU - Laitinen, Timo
AU - Piippo, Juha
PY - 1998
Y1 - 1998
U2 - 10.4028/www.scientific.net/MSF.289-292.193
DO - 10.4028/www.scientific.net/MSF.289-292.193
M3 - Article in a proceedings journal
VL - 289-292
SP - 193
EP - 202
JO - Materials Science Forum
JF - Materials Science Forum
SN - 0255-5476
ER -
Saario T, Laitinen T, Piippo J. Contact electric resistance (CER) technique for In-Situ characterisation of surface films. Materials Science Forum. 1998;289-292:193-202. https://doi.org/10.4028/www.scientific.net/MSF.289-292.193