Cooltronics: A new low-temperature tunneling-technology based on Silicon

T.E. Whall, M.J. Prest, J.S. Richardson-Bullock, V.A. Shah, M. Myronov, E.H.C. Parker, D.R. Leadley, Mika Prunnila, David Gunnarsson, T. Brien, D. Morozov, P: Mauskopf

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    A silicon-superconductor tunnel junction is capable of cooling electrons from a temperature of 300 mK to 150 mK and below when a current is passed through it and may also be used as the thermometer in a silicon cold electron bolometer. Recent work on these novel devices is described here.
    Original languageEnglish
    Title of host publicationConference proceedings
    Subtitle of host publicationInternational Conference on Ultimate Integration on Silicon, ULIS 2013
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages1-4
    ISBN (Electronic)978-1-4673-4802-7
    ISBN (Print)978-1-4673-4800-3
    DOIs
    Publication statusPublished - 2013
    MoE publication typeNot Eligible
    Event14th International Conference on Ultimate Integration on Silicon, ULIS 2013 - Coventry, United Kingdom
    Duration: 19 Mar 201321 Mar 2013
    Conference number: 14

    Conference

    Conference14th International Conference on Ultimate Integration on Silicon, ULIS 2013
    Abbreviated titleULIS 2013
    CountryUnited Kingdom
    CityCoventry
    Period19/03/1321/03/13

    Fingerprint Dive into the research topics of 'Cooltronics: A new low-temperature tunneling-technology based on Silicon'. Together they form a unique fingerprint.

  • Cite this

    Whall, T. E., Prest, M. J., Richardson-Bullock, J. S., Shah, V. A., Myronov, M., Parker, E. H. C., Leadley, D. R., Prunnila, M., Gunnarsson, D., Brien, T., Morozov, D., & Mauskopf, P. (2013). Cooltronics: A new low-temperature tunneling-technology based on Silicon. In Conference proceedings: International Conference on Ultimate Integration on Silicon, ULIS 2013 (pp. 1-4). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ULIS.2013.6523477