Cooltronics: A new low-temperature tunneling-technology based on Silicon

T.E. Whall, M.J. Prest, J.S. Richardson-Bullock, V.A. Shah, M. Myronov, E.H.C. Parker, D.R. Leadley, Mika Prunnila, David Gunnarsson, T. Brien, D. Morozov, P: Mauskopf

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    A silicon-superconductor tunnel junction is capable of cooling electrons from a temperature of 300 mK to 150 mK and below when a current is passed through it and may also be used as the thermometer in a silicon cold electron bolometer. Recent work on these novel devices is described here.
    Original languageEnglish
    Title of host publicationConference proceedings
    Subtitle of host publicationInternational Conference on Ultimate Integration on Silicon, ULIS 2013
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages1-4
    ISBN (Electronic)978-1-4673-4802-7
    ISBN (Print)978-1-4673-4800-3
    DOIs
    Publication statusPublished - 2013
    MoE publication typeNot Eligible
    Event14th International Conference on Ultimate Integration on Silicon, ULIS 2013 - Coventry, United Kingdom
    Duration: 19 Mar 201321 Mar 2013
    Conference number: 14

    Conference

    Conference14th International Conference on Ultimate Integration on Silicon, ULIS 2013
    Abbreviated titleULIS 2013
    CountryUnited Kingdom
    CityCoventry
    Period19/03/1321/03/13

    Fingerprint

    thermometers
    bolometers
    silicon
    tunnel junctions
    electrons
    cooling
    temperature

    Cite this

    Whall, T. E., Prest, M. J., Richardson-Bullock, J. S., Shah, V. A., Myronov, M., Parker, E. H. C., ... Mauskopf, P. (2013). Cooltronics: A new low-temperature tunneling-technology based on Silicon. In Conference proceedings: International Conference on Ultimate Integration on Silicon, ULIS 2013 (pp. 1-4). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/ULIS.2013.6523477
    Whall, T.E. ; Prest, M.J. ; Richardson-Bullock, J.S. ; Shah, V.A. ; Myronov, M. ; Parker, E.H.C. ; Leadley, D.R. ; Prunnila, Mika ; Gunnarsson, David ; Brien, T. ; Morozov, D. ; Mauskopf, P:. / Cooltronics : A new low-temperature tunneling-technology based on Silicon. Conference proceedings: International Conference on Ultimate Integration on Silicon, ULIS 2013. IEEE Institute of Electrical and Electronic Engineers , 2013. pp. 1-4
    @inproceedings{f553c4777a1b4aedb8a51c6afb40521d,
    title = "Cooltronics: A new low-temperature tunneling-technology based on Silicon",
    abstract = "A silicon-superconductor tunnel junction is capable of cooling electrons from a temperature of 300 mK to 150 mK and below when a current is passed through it and may also be used as the thermometer in a silicon cold electron bolometer. Recent work on these novel devices is described here.",
    author = "T.E. Whall and M.J. Prest and J.S. Richardson-Bullock and V.A. Shah and M. Myronov and E.H.C. Parker and D.R. Leadley and Mika Prunnila and David Gunnarsson and T. Brien and D. Morozov and P: Mauskopf",
    year = "2013",
    doi = "10.1109/ULIS.2013.6523477",
    language = "English",
    isbn = "978-1-4673-4800-3",
    pages = "1--4",
    booktitle = "Conference proceedings",
    publisher = "IEEE Institute of Electrical and Electronic Engineers",
    address = "United States",

    }

    Whall, TE, Prest, MJ, Richardson-Bullock, JS, Shah, VA, Myronov, M, Parker, EHC, Leadley, DR, Prunnila, M, Gunnarsson, D, Brien, T, Morozov, D & Mauskopf, P 2013, Cooltronics: A new low-temperature tunneling-technology based on Silicon. in Conference proceedings: International Conference on Ultimate Integration on Silicon, ULIS 2013. IEEE Institute of Electrical and Electronic Engineers , pp. 1-4, 14th International Conference on Ultimate Integration on Silicon, ULIS 2013, Coventry, United Kingdom, 19/03/13. https://doi.org/10.1109/ULIS.2013.6523477

    Cooltronics : A new low-temperature tunneling-technology based on Silicon. / Whall, T.E.; Prest, M.J.; Richardson-Bullock, J.S.; Shah, V.A.; Myronov, M.; Parker, E.H.C.; Leadley, D.R.; Prunnila, Mika; Gunnarsson, David; Brien, T.; Morozov, D.; Mauskopf, P:.

    Conference proceedings: International Conference on Ultimate Integration on Silicon, ULIS 2013. IEEE Institute of Electrical and Electronic Engineers , 2013. p. 1-4.

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    TY - GEN

    T1 - Cooltronics

    T2 - A new low-temperature tunneling-technology based on Silicon

    AU - Whall, T.E.

    AU - Prest, M.J.

    AU - Richardson-Bullock, J.S.

    AU - Shah, V.A.

    AU - Myronov, M.

    AU - Parker, E.H.C.

    AU - Leadley, D.R.

    AU - Prunnila, Mika

    AU - Gunnarsson, David

    AU - Brien, T.

    AU - Morozov, D.

    AU - Mauskopf, P:

    PY - 2013

    Y1 - 2013

    N2 - A silicon-superconductor tunnel junction is capable of cooling electrons from a temperature of 300 mK to 150 mK and below when a current is passed through it and may also be used as the thermometer in a silicon cold electron bolometer. Recent work on these novel devices is described here.

    AB - A silicon-superconductor tunnel junction is capable of cooling electrons from a temperature of 300 mK to 150 mK and below when a current is passed through it and may also be used as the thermometer in a silicon cold electron bolometer. Recent work on these novel devices is described here.

    U2 - 10.1109/ULIS.2013.6523477

    DO - 10.1109/ULIS.2013.6523477

    M3 - Conference article in proceedings

    SN - 978-1-4673-4800-3

    SP - 1

    EP - 4

    BT - Conference proceedings

    PB - IEEE Institute of Electrical and Electronic Engineers

    ER -

    Whall TE, Prest MJ, Richardson-Bullock JS, Shah VA, Myronov M, Parker EHC et al. Cooltronics: A new low-temperature tunneling-technology based on Silicon. In Conference proceedings: International Conference on Ultimate Integration on Silicon, ULIS 2013. IEEE Institute of Electrical and Electronic Engineers . 2013. p. 1-4 https://doi.org/10.1109/ULIS.2013.6523477