Original language | English |
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Pages (from-to) | 532-536 |
Journal | IEEE Transactions on Electron Devices |
Volume | 34 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1987 |
MoE publication type | A1 Journal article-refereed |
Current crowding and misaligment effects as sources of error in contact resistivity measurements: Part II. Experimental results and computer simulation of self-aligned test structures
Paolo Cappelletti, Manuela Finetti, Andrea Scorzoni, Ilkka Suni, Nadia Circelli, Libera Giovanna Dalla
Research output: Contribution to journal › Article › Scientific › peer-review
14
Citations
(Scopus)