Abstract
The effect of voltage ramp rate on the short-term dielectric breakdown strength of polymer nanocomposites is not well-documented. In this paper, the effect of DC field ramp rate on the large-area breakdown performance of melt-extruded bi-axially oriented polypropylene (BOPP) films incorporating 4.5 wt-% of nano-silica is studied. By utilizing a self-healing multi-breakdown measurement method with a variable DC voltage ramp rate, a statistically large amount of breakdown data was obtained from a large total sample film area as a function of DC field ramp rate (0.1-50 Vs-1μm-1)). With a decreasing ramp rate, Weibull statistical analysis of the breakdown data suggests a systematically decreasing trend in the breakdown strength (Weibull α) and an increase in the Weibull shape parameter of time (>1) for the nanocomposite. The observed behavior is speculated to be attributable to highly altered internal charge dynamics of the silica-BOPP nanocomposite. The results exemplify the importance of careful breakdown strength assessment when dielectric films of more complex internal structure are studied.
Original language | English |
---|---|
Title of host publication | Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 496-499 |
ISBN (Electronic) | 978-1-4799-8903-4, 978-1-4799-8902-7 |
DOIs | |
Publication status | Published - 15 Oct 2015 |
MoE publication type | A4 Article in a conference publication |
Event | IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 - Sydney, Australia Duration: 19 Jul 2015 → 22 Jul 2015 Conference number: 11 |
Conference
Conference | IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 |
---|---|
Abbreviated title | ICPADM 2015 |
Country/Territory | Australia |
City | Sydney |
Period | 19/07/15 → 22/07/15 |
Keywords
- BOPP
- silica
- nanocomposite
- breakdown
- ramp rate dependence
- weibull