Abstract
| Original language | English |
|---|---|
| Title of host publication | Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the |
| Publisher | IEEE Institute of Electrical and Electronic Engineers |
| Pages | 496-499 |
| ISBN (Electronic) | 978-1-4799-8903-4, 978-1-4799-8902-7 |
| DOIs | |
| Publication status | Published - 15 Oct 2015 |
| MoE publication type | A4 Article in a conference publication |
| Event | IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 - Sydney, Australia Duration: 19 Jul 2015 → 22 Jul 2015 Conference number: 11 |
Conference
| Conference | IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 |
|---|---|
| Abbreviated title | ICPADM 2015 |
| Country | Australia |
| City | Sydney |
| Period | 19/07/15 → 22/07/15 |
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Keywords
- BOPP
- silica
- nanocomposite
- breakdown
- ramp rate dependence
- weibull
Cite this
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DC ramp rate effect on the breakdown response of SiO2-BOPP nanocomposites. / Rytöluoto, Ilkka; Ritamäki, Mikael; Lahti, Kari; Karttunen, Mikko.
Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the. IEEE Institute of Electrical and Electronic Engineers , 2015. p. 496-499.Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
TY - GEN
T1 - DC ramp rate effect on the breakdown response of SiO2-BOPP nanocomposites
AU - Rytöluoto, Ilkka
AU - Ritamäki, Mikael
AU - Lahti, Kari
AU - Karttunen, Mikko
PY - 2015/10/15
Y1 - 2015/10/15
N2 - The effect of voltage ramp rate on the short-term dielectric breakdown strength of polymer nanocomposites is not well-documented. In this paper, the effect of DC field ramp rate on the large-area breakdown performance of melt-extruded bi-axially oriented polypropylene (BOPP) films incorporating 4.5 wt-% of nano-silica is studied. By utilizing a self-healing multi-breakdown measurement method with a variable DC voltage ramp rate, a statistically large amount of breakdown data was obtained from a large total sample film area as a function of DC field ramp rate (0.1-50 Vs-1μm-1)). With a decreasing ramp rate, Weibull statistical analysis of the breakdown data suggests a systematically decreasing trend in the breakdown strength (Weibull α) and an increase in the Weibull shape parameter of time (>1) for the nanocomposite. The observed behavior is speculated to be attributable to highly altered internal charge dynamics of the silica-BOPP nanocomposite. The results exemplify the importance of careful breakdown strength assessment when dielectric films of more complex internal structure are studied.
AB - The effect of voltage ramp rate on the short-term dielectric breakdown strength of polymer nanocomposites is not well-documented. In this paper, the effect of DC field ramp rate on the large-area breakdown performance of melt-extruded bi-axially oriented polypropylene (BOPP) films incorporating 4.5 wt-% of nano-silica is studied. By utilizing a self-healing multi-breakdown measurement method with a variable DC voltage ramp rate, a statistically large amount of breakdown data was obtained from a large total sample film area as a function of DC field ramp rate (0.1-50 Vs-1μm-1)). With a decreasing ramp rate, Weibull statistical analysis of the breakdown data suggests a systematically decreasing trend in the breakdown strength (Weibull α) and an increase in the Weibull shape parameter of time (>1) for the nanocomposite. The observed behavior is speculated to be attributable to highly altered internal charge dynamics of the silica-BOPP nanocomposite. The results exemplify the importance of careful breakdown strength assessment when dielectric films of more complex internal structure are studied.
KW - BOPP
KW - silica
KW - nanocomposite
KW - breakdown
KW - ramp rate dependence
KW - weibull
U2 - 10.1109/ICPADM.2015.7295317
DO - 10.1109/ICPADM.2015.7295317
M3 - Conference article in proceedings
SP - 496
EP - 499
BT - Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the
PB - IEEE Institute of Electrical and Electronic Engineers
ER -