Abstract
Long-term stability of a dc voltage standard based on a capacitive microelectromechanical system (MEMS) is investigated. Square-wave voltage actuation was used to cancel the effect of slow charging appearing in the dielectric layers and capacitor plate surfaces of the MEMS capacitor. The key properties of a MEMS capacitor and the operational principle and the measurement results of the apparatus that implements the voltage standard are explained. Negligible voltage drift within the measurement scatter of ± 2 parts per million during a 22-day measurement period was demonstrated.
| Original language | English |
|---|---|
| Pages (from-to) | 2506-2511 |
| Number of pages | 6 |
| Journal | IEEE Transactions on Instrumentation and Measurement |
| Volume | 60 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 2011 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- measurement standards
- microelectromechanical devices
- stability voltage