Abstract
Deep reactive ion etching (DRIE) processes have been developed for
fabricating fluidic devices in glass (Pyrex™ and fused silica)
substrates with cavities deeper than 100 µm. By using a standard silicon
wafer as the etch mask, patterned by silicon DRIE, very deep and nearly
vertical structures can be etched into the glass. In this work, an
atmospheric pressure chemical ionization chip was fabricated. Also the
results show potential for satisfactory etch characteristics with Ni,
amorphous silicon (a-Si) and SU-8 as mask materials.
Original language | English |
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Article number | 064010 |
Number of pages | 6 |
Journal | Journal of Micromechanics and Microengineering |
Volume | 18 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2008 |
MoE publication type | A1 Journal article-refereed |