Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

Haitao Zheng (Corresponding Author), Linghao Zhou, Ryan Marks, Tuomas Happonen, Thomas Kraft

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Abstract

The demand for flexible large area optoelectronic devices such as organic light-emitting diodes (OLEDs) and organic photovoltaics (OPVs) is growing. Roll-to-roll (R2R) printing enables cost-efficient industrial production of optoelectronic devices. The performance of electronic devices may significantly suffer from local electrical defects. The dark lock-in infrared thermography (DLIT) method is an effective non-destructive testing (NDT) tool to identify such defects as hot spots. In this study, a DLIT inspection system was applied to visualize the defects of R2R printed silver conductors on flexible plastic substrates. A two-stage automated defect recognition (ADR) methodology was proposed to detect and localize two types of typical electrical defects, which are caused by complete or partial breaks on the printed conductive wires, based on localized segmentation and thresholding methods.
Original languageEnglish
Article number2005
Number of pages16
JournalApplied Sciences
Volume12
Issue number4
DOIs
Publication statusPublished - 15 Feb 2022
MoE publication typeA1 Journal article-refereed

Keywords

  • Automated defect recognition
  • Dark lock-in thermography
  • Non-destructive testing
  • Organic photovoltaic
  • Printing
  • Roll-to-roll
  • Thin film

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