Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

Haitao Zheng; Linghao Zhou; Ryan Marks; Tuomas Happonen; Thomas Kraft

doi:10.3390/app12042005

Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

Haitao Zheng (Corresponding Author), Linghao Zhou, Ryan Marks, Tuomas Happonen, Thomas Kraft

The Welding Institute

Research output: Contribution to journal › Article › Scientific › peer-review

4 Citations (Scopus)

55 Downloads (Pure)

Abstract

The demand for flexible large area optoelectronic devices such as organic light-emitting diodes (OLEDs) and organic photovoltaics (OPVs) is growing. Roll-to-roll (R2R) printing enables cost-efficient industrial production of optoelectronic devices. The performance of electronic devices may significantly suffer from local electrical defects. The dark lock-in infrared thermography (DLIT) method is an effective non-destructive testing (NDT) tool to identify such defects as hot spots. In this study, a DLIT inspection system was applied to visualize the defects of R2R printed silver conductors on flexible plastic substrates. A two-stage automated defect recognition (ADR) methodology was proposed to detect and localize two types of typical electrical defects, which are caused by complete or partial breaks on the printed conductive wires, based on localized segmentation and thresholding methods.

Original language	English
Article number	2005
Number of pages	16
Journal	Applied Sciences
Volume	12
Issue number	4
DOIs	https://doi.org/10.3390/app12042005
Publication status	Published - 15 Feb 2022
MoE publication type	A1 Journal article-refereed

Keywords

Automated defect recognition
Dark lock-in thermography
Non-destructive testing
Organic photovoltaic
Printing
Roll-to-roll
Thin film

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.3390/app12042005Licence: CC BY

app12042005 Final published version, 1.81 MBLicence: CC BY

Cite this

@article{20502eed54574da985325521fa766d55,

title = "Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation",

abstract = "The demand for flexible large area optoelectronic devices such as organic light-emitting diodes (OLEDs) and organic photovoltaics (OPVs) is growing. Roll-to-roll (R2R) printing enables cost-efficient industrial production of optoelectronic devices. The performance of electronic devices may significantly suffer from local electrical defects. The dark lock-in infrared thermography (DLIT) method is an effective non-destructive testing (NDT) tool to identify such defects as hot spots. In this study, a DLIT inspection system was applied to visualize the defects of R2R printed silver conductors on flexible plastic substrates. A two-stage automated defect recognition (ADR) methodology was proposed to detect and localize two types of typical electrical defects, which are caused by complete or partial breaks on the printed conductive wires, based on localized segmentation and thresholding methods.",

keywords = "Automated defect recognition, Dark lock-in thermography, Non-destructive testing, Organic photovoltaic, Printing, Roll-to-roll, Thin film",

author = "Haitao Zheng and Linghao Zhou and Ryan Marks and Tuomas Happonen and Thomas Kraft",

note = "Funding Information: The OLEDSOLAR project has received funding from the European Union?s Horizon 2020 under grant agreement number 820789. ",

year = "2022",

month = feb,

day = "15",

doi = "10.3390/app12042005",

language = "English",

volume = "12",

journal = "Applied Sciences",

issn = "2076-3417",

publisher = "MDPI",

number = "4",

}

TY - JOUR

T1 - Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

AU - Zheng , Haitao

AU - Zhou, Linghao

AU - Marks, Ryan

AU - Happonen, Tuomas

AU - Kraft, Thomas

N1 - Funding Information: The OLEDSOLAR project has received funding from the European Union?s Horizon 2020 under grant agreement number 820789.

PY - 2022/2/15

Y1 - 2022/2/15

N2 - The demand for flexible large area optoelectronic devices such as organic light-emitting diodes (OLEDs) and organic photovoltaics (OPVs) is growing. Roll-to-roll (R2R) printing enables cost-efficient industrial production of optoelectronic devices. The performance of electronic devices may significantly suffer from local electrical defects. The dark lock-in infrared thermography (DLIT) method is an effective non-destructive testing (NDT) tool to identify such defects as hot spots. In this study, a DLIT inspection system was applied to visualize the defects of R2R printed silver conductors on flexible plastic substrates. A two-stage automated defect recognition (ADR) methodology was proposed to detect and localize two types of typical electrical defects, which are caused by complete or partial breaks on the printed conductive wires, based on localized segmentation and thresholding methods.

AB - The demand for flexible large area optoelectronic devices such as organic light-emitting diodes (OLEDs) and organic photovoltaics (OPVs) is growing. Roll-to-roll (R2R) printing enables cost-efficient industrial production of optoelectronic devices. The performance of electronic devices may significantly suffer from local electrical defects. The dark lock-in infrared thermography (DLIT) method is an effective non-destructive testing (NDT) tool to identify such defects as hot spots. In this study, a DLIT inspection system was applied to visualize the defects of R2R printed silver conductors on flexible plastic substrates. A two-stage automated defect recognition (ADR) methodology was proposed to detect and localize two types of typical electrical defects, which are caused by complete or partial breaks on the printed conductive wires, based on localized segmentation and thresholding methods.

KW - Automated defect recognition

KW - Dark lock-in thermography

KW - Non-destructive testing

KW - Organic photovoltaic

KW - Printing

KW - Roll-to-roll

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=85124713060&partnerID=8YFLogxK

U2 - 10.3390/app12042005

DO - 10.3390/app12042005

M3 - Article

SN - 2076-3417

VL - 12

JO - Applied Sciences

JF - Applied Sciences

IS - 4

M1 - 2005

ER -

Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

Abstract

Keywords

UN SDGs

Access to Document

Other files and links

Fingerprint

OLEDSOLAR: Innovative manufacturing processes and in-line monitoring techniques for the OLED and thin film and organic photovoltaic industries (CIGS and OPV)

Cite this

Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

Abstract

Keywords

UN SDGs

Access to Document

Other files and links

Fingerprint

Projects

OLEDSOLAR: Innovative manufacturing processes and in-line monitoring techniques for the OLED and thin film and organic photovoltaic industries (CIGS and OPV)

Cite this