Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation

Haitao Zheng (Corresponding Author), Linghao Zhou, Ryan Marks, Tuomas Happonen, Thomas Kraft

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
55 Downloads (Pure)

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