Abstract
| Original language | English |
|---|---|
| Title of host publication | Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies (NPIC&HMIT 2017) |
| Publisher | American Nuclear Society (ANS) |
| Pages | 568-580 |
| ISBN (Electronic) | 978-0-89448-738-5 |
| ISBN (Print) | 978-0-89448-743-9 |
| Publication status | Published - 2017 |
| MoE publication type | A4 Article in a conference publication |
| Event | 10th International Topical Meeting on Nuclear Plant Instrumentation, Control and Human Machine Interface Technologies, NPIC & HMIT 2017 - San Francisco, United States Duration: 11 Jun 2017 → 15 Jun 2017 |
Conference
| Conference | 10th International Topical Meeting on Nuclear Plant Instrumentation, Control and Human Machine Interface Technologies, NPIC & HMIT 2017 |
|---|---|
| Abbreviated title | NPIC & HMIT 2017 |
| Country/Territory | United States |
| City | San Francisco |
| Period | 11/06/17 → 15/06/17 |
Keywords
- safety demonstration
- model-based systems engineering
- safety argumentation
- nuclear I&C
Fingerprint
Dive into the research topics of 'Demonstrating and argumenting safety of I&C systems: challenges and recent experiences'. Together they form a unique fingerprint.Projects
- 1 Finished
-
SAUNA: Integrated safety assessment and justification of nuclear power plant automation
Pakonen, A. (Manager), Tommila, T. (Participant), Alanen, J. (Participant), Björkman, K. (Participant), Laarni, J. (Participant), Lahtinen, J. (Participant), Oedewald, P. (Participant), Papakonstantinou, N. (Participant), Reiman, T. (Participant), Tyrväinen, T. (Participant), Valkonen, J. (Participant), Koskinen, H. (Participant), Porthin, M. (Participant), Savioja, P. (Participant), Linnosmaa, J. (Participant), Vyatkin, V. (Participant), Pang, C. (Participant), Buzhinsky, I. (Participant), Varkoi, T. (Participant), Nevalainen, R. (Participant), Holmberg, J.-E. (Participant), Uusitalo, E. (Participant) & Koskela, M. (Participant)
1/02/15 → 31/01/19
Project: Research
Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver