Skip to main navigation Skip to search Skip to main content

Dependence of melting, roughness and contact resistances on Ge and Ni content in alloyed AuGe/Ni/Au-type electrical contacts to GaAs/AlGaAs multilayer structures

  • University of Hyderabad
  • Indian Institute of Chemical Technology (CSIR-IICT)

Research output: Contribution to journalArticleScientificpeer-review

Fingerprint

Dive into the research topics of 'Dependence of melting, roughness and contact resistances on Ge and Ni content in alloyed AuGe/Ni/Au-type electrical contacts to GaAs/AlGaAs multilayer structures'. Together they form a unique fingerprint.
Sort by

Keyphrases

INIS

Engineering

Material Science