Detection and Removal of Short-circuits on GEM-foils

M. Kalliokoski; T. Hilden; R. Lauhakangas; P. Karppinen; T. Karppinen; R. Turpeinen; J. Heino; E. Tuominen

doi:10.1016/j.phpro.2012.02.394

Detection and Removal of Short-circuits on GEM-foils

M. Kalliokoski (Corresponding Author), T. Hilden, R. Lauhakangas, P. Karppinen, T. Karppinen, R. Turpeinen, J. Heino, E. Tuominen

Not published at VTT

University of Helsinki

Research output: Contribution to journal › Article in a proceedings journal › Scientific › peer-review

2 Citations (Scopus)

Abstract

High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of "burning" shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.

Original language	English
Pages (from-to)	464-471
Number of pages	8
Journal	Physics Procedia
Volume	37
DOIs	https://doi.org/10.1016/j.phpro.2012.02.394
Publication status	Published - 2012
MoE publication type	A4 Article in a conference publication
Event	2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011 - Chicago, United States Duration: 9 Jun 2011 → 14 Jun 2011

Keywords

GEM
optical scanning system
short-circuit

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10.1016/j.phpro.2012.02.394Licence: CC BY-NC-ND

Cite this

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title = "Detection and Removal of Short-circuits on GEM-foils",

abstract = "High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of {"}burning{"} shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.",

keywords = "GEM, optical scanning system, short-circuit",

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AU - Kalliokoski, M.

AU - Hilden, T.

AU - Lauhakangas, R.

AU - Karppinen, P.

AU - Karppinen, T.

AU - Turpeinen, R.

AU - Heino, J.

AU - Tuominen, E.

PY - 2012

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AB - High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of "burning" shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.

KW - GEM

KW - optical scanning system

KW - short-circuit

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DO - 10.1016/j.phpro.2012.02.394

M3 - Article in a proceedings journal

AN - SCOPUS:85039056287

SN - 1875-3884

VL - 37

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EP - 471

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ER -

Detection and Removal of Short-circuits on GEM-foils

Abstract

Keywords

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