Detection and Removal of Short-circuits on GEM-foils

M. Kalliokoski; T. Hilden; R. Lauhakangas; P. Karppinen; T. Karppinen; R. Turpeinen; J. Heino; Eija Tuominen

doi:10.1016/j.phpro.2012.02.394

Detection and Removal of Short-circuits on GEM-foils

M. Kalliokoski^*
, T. Hilden
, R. Lauhakangas
, P. Karppinen
, T. Karppinen
, R. Turpeinen
, J. Heino
, Eija Tuominen

^*Corresponding author for this work

Not published at VTT

University of Helsinki

Research output: Contribution to journal › Article in a proceedings journal › Scientific › peer-review

2 Citations (Scopus)

Abstract

High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of "burning" shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.

Original language	English
Pages (from-to)	464-471
Journal	Physics Procedia
Volume	37
DOIs	https://doi.org/10.1016/j.phpro.2012.02.394
Publication status	Published - 2012
MoE publication type	A4 Article in a conference publication
Event	2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011 - Chicago, United States Duration: 9 Jun 2011 → 14 Jun 2011

Keywords

GEM
optical scanning system
short-circuit

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10.1016/j.phpro.2012.02.394Licence: CC BY-NC-ND

Cite this

@article{e92101c22ed14544a3a3f5e71fd4eace,

title = "Detection and Removal of Short-circuits on GEM-foils",

abstract = "High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of {"}burning{"} shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.",

keywords = "GEM, optical scanning system, short-circuit",

author = "M. Kalliokoski and T. Hilden and R. Lauhakangas and P. Karppinen and T. Karppinen and R. Turpeinen and J. Heino and Eija Tuominen",

year = "2012",

doi = "10.1016/j.phpro.2012.02.394",

language = "English",

volume = "37",

pages = "464--471",

journal = "Physics Procedia",

issn = "1875-3884",

publisher = "Elsevier",

note = "2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011 ; Conference date: 09-06-2011 Through 14-06-2011",

}

TY - JOUR

T1 - Detection and Removal of Short-circuits on GEM-foils

AU - Kalliokoski, M.

AU - Hilden, T.

AU - Lauhakangas, R.

AU - Karppinen, P.

AU - Karppinen, T.

AU - Turpeinen, R.

AU - Heino, J.

AU - Tuominen, Eija

PY - 2012

Y1 - 2012

N2 - High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of "burning" shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.

AB - High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of "burning" shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.

KW - GEM

KW - optical scanning system

KW - short-circuit

UR - https://www.scopus.com/pages/publications/85039056287

U2 - 10.1016/j.phpro.2012.02.394

DO - 10.1016/j.phpro.2012.02.394

M3 - Article in a proceedings journal

AN - SCOPUS:85039056287

SN - 1875-3884

VL - 37

SP - 464

EP - 471

JO - Physics Procedia

JF - Physics Procedia

T2 - 2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011

Y2 - 9 June 2011 through 14 June 2011

ER -

Detection and Removal of Short-circuits on GEM-foils

Abstract

Keywords

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