Abstract
Recent developments with InGaAs- and PbS-materials have resulted in high quality array detectors, which are very useful for spectroscopy applications. These arrays are used as building blocks in a variety of NIR spectral sensors, which are offered for research, field and process measurements. While the detector array technique is very promising for widening the area of NIR instrumentation to new process applications, not enough is known of the practical limitations and performance tradeoffs of the technique. This poster is based on practical experiences gained in VTT Electronics with the development of “TQA Analyzer”, and on evaluation results of commercial InGaAs-array spectrometers.
Original language | English |
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Publication status | Published - 2002 |
MoE publication type | Not Eligible |
Event | 11th International Diffuse Reflectance Conference, IDRC-2002 - Chambersburg, United States Duration: 10 Aug 2002 → 16 Aug 2002 |
Conference
Conference | 11th International Diffuse Reflectance Conference, IDRC-2002 |
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Country/Territory | United States |
City | Chambersburg |
Period | 10/08/02 → 16/08/02 |
Keywords
- Near infrared spectroscopy
- instrumentation
- inGaAs detector
- PbS detector