Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra

Peeter Paris, Mart Aints, Antti Hakola, Madis Kiisk, Jukka Kolehmainen, Matti Laan, Jari Likonen, Cristian Ruset, Kazuyoshi Sugiyama, Sanna Tervakangas

    Research output: Contribution to journalArticleScientificpeer-review

    23 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1125-1128
    JournalFusion Engineering and Design
    Volume86
    Issue number6-8
    DOIs
    Publication statusPublished - 2011
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Plasma-facing components
    • Low-Z coating
    • LIBS
    • Compositional mapping
    • Signal-background ratio

    Cite this

    Paris, P., Aints, M., Hakola, A., Kiisk, M., Kolehmainen, J., Laan, M., Likonen, J., Ruset, C., Sugiyama, K., & Tervakangas, S. (2011). Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra. Fusion Engineering and Design, 86(6-8), 1125-1128. https://doi.org/10.1016/j.fusengdes.2011.01.117