Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra

Peeter Paris, Mart Aints, Antti Hakola, Madis Kiisk, Jukka Kolehmainen, Matti Laan, Jari Likonen, Cristian Ruset, Kazuyoshi Sugiyama, Sanna Tervakangas

    Research output: Contribution to journalArticleScientificpeer-review

    22 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1125-1128
    JournalFusion Engineering and Design
    Volume86
    Issue number6-8
    DOIs
    Publication statusPublished - 2011
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Plasma-facing components
    • Low-Z coating
    • LIBS
    • Compositional mapping
    • Signal-background ratio

    Cite this

    Paris, Peeter ; Aints, Mart ; Hakola, Antti ; Kiisk, Madis ; Kolehmainen, Jukka ; Laan, Matti ; Likonen, Jari ; Ruset, Cristian ; Sugiyama, Kazuyoshi ; Tervakangas, Sanna. / Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra. In: Fusion Engineering and Design. 2011 ; Vol. 86, No. 6-8. pp. 1125-1128.
    @article{2351c09eb42c49d89e1ddb88caf10063,
    title = "Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra",
    keywords = "Plasma-facing components, Low-Z coating, LIBS, Compositional mapping, Signal-background ratio",
    author = "Peeter Paris and Mart Aints and Antti Hakola and Madis Kiisk and Jukka Kolehmainen and Matti Laan and Jari Likonen and Cristian Ruset and Kazuyoshi Sugiyama and Sanna Tervakangas",
    year = "2011",
    doi = "10.1016/j.fusengdes.2011.01.117",
    language = "English",
    volume = "86",
    pages = "1125--1128",
    journal = "Fusion Engineering and Design",
    issn = "0920-3796",
    publisher = "Elsevier",
    number = "6-8",

    }

    Paris, P, Aints, M, Hakola, A, Kiisk, M, Kolehmainen, J, Laan, M, Likonen, J, Ruset, C, Sugiyama, K & Tervakangas, S 2011, 'Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra', Fusion Engineering and Design, vol. 86, no. 6-8, pp. 1125-1128. https://doi.org/10.1016/j.fusengdes.2011.01.117

    Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra. / Paris, Peeter; Aints, Mart; Hakola, Antti; Kiisk, Madis; Kolehmainen, Jukka; Laan, Matti; Likonen, Jari; Ruset, Cristian; Sugiyama, Kazuyoshi; Tervakangas, Sanna.

    In: Fusion Engineering and Design, Vol. 86, No. 6-8, 2011, p. 1125-1128.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - Determination of elemental depth profiles by multi-spot averaging technique of LIBS spectra

    AU - Paris, Peeter

    AU - Aints, Mart

    AU - Hakola, Antti

    AU - Kiisk, Madis

    AU - Kolehmainen, Jukka

    AU - Laan, Matti

    AU - Likonen, Jari

    AU - Ruset, Cristian

    AU - Sugiyama, Kazuyoshi

    AU - Tervakangas, Sanna

    PY - 2011

    Y1 - 2011

    KW - Plasma-facing components

    KW - Low-Z coating

    KW - LIBS

    KW - Compositional mapping

    KW - Signal-background ratio

    U2 - 10.1016/j.fusengdes.2011.01.117

    DO - 10.1016/j.fusengdes.2011.01.117

    M3 - Article

    VL - 86

    SP - 1125

    EP - 1128

    JO - Fusion Engineering and Design

    JF - Fusion Engineering and Design

    SN - 0920-3796

    IS - 6-8

    ER -