The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths
|Publication status||Published - 2012|
|MoE publication type||Not Eligible|
|Event||16th International Conference on Solid Films and Surfaces, ICSFS16 - Genova, Switzerland|
Duration: 1 Jul 2012 → 6 Jul 2012
|Conference||16th International Conference on Solid Films and Surfaces, ICSFS16|
|Period||1/07/12 → 6/07/12|
Albers, W. M., Viitala, T., Granqvist, N., Liang, H., Sadowski, J. W., Vikholm-Lundin, I. M., & Tappura, K. (2012). Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy. Abstract from 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland.