Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

Willem M. Albers, Tapani Viitala, Niko Granqvist, Huamin Liang, Janusz W. Sadowski, Inger M. Vikholm-Lundin, Kirsi Tappura

Research output: Contribution to conferenceConference AbstractScientificpeer-review

Abstract

The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths
Original languageEnglish
Publication statusPublished - 2012
MoE publication typeNot Eligible
Event16th International Conference on Solid Films and Surfaces, ICSFS16 - Genova, Switzerland
Duration: 1 Jul 20126 Jul 2012

Conference

Conference16th International Conference on Solid Films and Surfaces, ICSFS16
Abbreviated titleICSFS
CountrySwitzerland
CityGenova
Period1/07/126/07/12

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thin films
surface plasmon resonance
wavelengths
spectroscopy
ellipsometry
refractivity
decomposition

Cite this

Albers, W. M., Viitala, T., Granqvist, N., Liang, H., Sadowski, J. W., Vikholm-Lundin, I. M., & Tappura, K. (2012). Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy. Abstract from 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland.
Albers, Willem M. ; Viitala, Tapani ; Granqvist, Niko ; Liang, Huamin ; Sadowski, Janusz W. ; Vikholm-Lundin, Inger M. ; Tappura, Kirsi. / Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy. Abstract from 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland.
@conference{2c39075f3770475f83c4cb36b94a8a98,
title = "Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy",
abstract = "The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths",
author = "Albers, {Willem M.} and Tapani Viitala and Niko Granqvist and Huamin Liang and Sadowski, {Janusz W.} and Vikholm-Lundin, {Inger M.} and Kirsi Tappura",
note = "Not in proceedings. Project code: 76627 (SPRNavi-nd); 16th International Conference on Solid Films and Surfaces, ICSFS16, ICSFS ; Conference date: 01-07-2012 Through 06-07-2012",
year = "2012",
language = "English",

}

Albers, WM, Viitala, T, Granqvist, N, Liang, H, Sadowski, JW, Vikholm-Lundin, IM & Tappura, K 2012, 'Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy' 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland, 1/07/12 - 6/07/12, .

Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy. / Albers, Willem M.; Viitala, Tapani; Granqvist, Niko; Liang, Huamin; Sadowski, Janusz W.; Vikholm-Lundin, Inger M.; Tappura, Kirsi.

2012. Abstract from 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland.

Research output: Contribution to conferenceConference AbstractScientificpeer-review

TY - CONF

T1 - Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

AU - Albers, Willem M.

AU - Viitala, Tapani

AU - Granqvist, Niko

AU - Liang, Huamin

AU - Sadowski, Janusz W.

AU - Vikholm-Lundin, Inger M.

AU - Tappura, Kirsi

N1 - Not in proceedings. Project code: 76627 (SPRNavi-nd)

PY - 2012

Y1 - 2012

N2 - The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths

AB - The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths

M3 - Conference Abstract

ER -

Albers WM, Viitala T, Granqvist N, Liang H, Sadowski JW, Vikholm-Lundin IM et al. Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy. 2012. Abstract from 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland.