Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

Willem M. Albers; Tapani Viitala; Niko Granqvist; Huamin Liang; Janusz W. Sadowski; Inger M. Vikholm-Lundin; Kirsi Tappura

Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

Willem M. Albers, Tapani Viitala, Niko Granqvist, Huamin Liang, Janusz W. Sadowski, Inger M. Vikholm-Lundin, Kirsi Tappura

Research output: Contribution to conference › Conference Abstract › Scientific › peer-review

Abstract

The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths

Original language	English
Publication status	Published - 2012
MoE publication type	Not Eligible
Event	16th International Conference on Solid Films and Surfaces, ICSFS16 - Genova, Switzerland Duration: 1 Jul 2012 → 6 Jul 2012

Conference

Conference	16th International Conference on Solid Films and Surfaces, ICSFS16
Abbreviated title	ICSFS
Country/Territory	Switzerland
City	Genova
Period	1/07/12 → 6/07/12

Cite this

@conference{2c39075f3770475f83c4cb36b94a8a98,

title = "Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy",

abstract = "The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths",

author = "Albers, {Willem M.} and Tapani Viitala and Niko Granqvist and Huamin Liang and Sadowski, {Janusz W.} and Vikholm-Lundin, {Inger M.} and Kirsi Tappura",

note = "Not in proceedings. Project code: 76627 (SPRNavi-nd); 16th International Conference on Solid Films and Surfaces, ICSFS16, ICSFS ; Conference date: 01-07-2012 Through 06-07-2012",

year = "2012",

language = "English",

}

Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy. / Albers, Willem M.; Viitala, Tapani; Granqvist, Niko et al.
2012. Abstract from 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland.

Research output: Contribution to conference › Conference Abstract › Scientific › peer-review

TY - CONF

T1 - Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

AU - Albers, Willem M.

AU - Viitala, Tapani

AU - Granqvist, Niko

AU - Liang, Huamin

AU - Sadowski, Janusz W.

AU - Vikholm-Lundin, Inger M.

AU - Tappura, Kirsi

N1 - Not in proceedings. Project code: 76627 (SPRNavi-nd)

PY - 2012

Y1 - 2012

N2 - The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths

AB - The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths

M3 - Conference Abstract

T2 - 16th International Conference on Solid Films and Surfaces, ICSFS16

Y2 - 1 July 2012 through 6 July 2012

ER -

Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

Abstract

Conference

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