Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

Willem M. Albers, Tapani Viitala, Niko Granqvist, Huamin Liang, Janusz W. Sadowski, Inger M. Vikholm-Lundin, Kirsi Tappura

    Research output: Contribution to conferenceConference AbstractScientificpeer-review

    Abstract

    The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelengths
    Original languageEnglish
    Publication statusPublished - 2012
    MoE publication typeNot Eligible
    Event16th International Conference on Solid Films and Surfaces, ICSFS16 - Genova, Switzerland
    Duration: 1 Jul 20126 Jul 2012

    Conference

    Conference16th International Conference on Solid Films and Surfaces, ICSFS16
    Abbreviated titleICSFS
    CountrySwitzerland
    CityGenova
    Period1/07/126/07/12

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    Albers, W. M., Viitala, T., Granqvist, N., Liang, H., Sadowski, J. W., Vikholm-Lundin, I. M., & Tappura, K. (2012). Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy. Abstract from 16th International Conference on Solid Films and Surfaces, ICSFS16, Genova, Switzerland.