Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry

F. Ghezzi (Corresponding Author), R. Caniello, D. Giubertoni, M. Bersani, Antti Hakola, M. Mayer, V. Rohde, M. Anderle, ASDEX Upgrade Team

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Abstract

We present the results of a study where secondary ion mass spectrometry (SIMS) has been used to obtain depth profiles of deuterium concentration on plasma facing components of the first wall of the ASDEX Upgrade tokamak. The method uses primary and secondary standards to quantify the amount of deuterium retained. Samples of bulk graphite coated with tungsten or tantalum-doped tungsten are independently profiled with three different SIMS instruments. Their deuterium concentration profiles are compared showing good agreement. In order to assess the validity of the method, the integrated deuterium concentrations in the coatings given by one of the SIMS devices is compared with nuclear reaction analysis (NRA) data. Although in the case of tungsten the agreement between NRA and SIMS is satisfactory, for tantalum-doped tungsten samples the discrepancy is significant because of matrix effect induced by tantalum and differently eroded surface (W + Ta always exposed to plasma, W largely shadowed). A further comparison where the SIMS deuterium concentration is obtained by calibrating the measurements against NRA values is also presented. For the tungsten samples, where no Ta induced matrix effects are present, the two methods are almost equivalent.The results presented show the potential of the method provided that the standards used for the calibration reproduce faithfully the matrix nature of the samples.
Original languageEnglish
Pages (from-to)459-466
JournalApplied Surface Science
Volume315
DOIs
Publication statusPublished - 2014
MoE publication typeA1 Journal article-refereed

Fingerprint

Tungsten
Deuterium
Tile
Secondary ion mass spectrometry
Tantalum
Nuclear reactions
Plasmas
Value engineering
Graphite
Calibration
Coatings

Keywords

  • fusion energy
  • tokamaks
  • plasma
  • secondary ion mass spectometry
  • deuterium concentration
  • depth profile
  • relative sensitivity factor

Cite this

Ghezzi, F. ; Caniello, R. ; Giubertoni, D. ; Bersani, M. ; Hakola, Antti ; Mayer, M. ; Rohde, V. ; Anderle, M. ; Team, ASDEX Upgrade. / Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry. In: Applied Surface Science. 2014 ; Vol. 315. pp. 459-466.
@article{f733601e0ac54e32b263cfb6fe01a767,
title = "Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry",
abstract = "We present the results of a study where secondary ion mass spectrometry (SIMS) has been used to obtain depth profiles of deuterium concentration on plasma facing components of the first wall of the ASDEX Upgrade tokamak. The method uses primary and secondary standards to quantify the amount of deuterium retained. Samples of bulk graphite coated with tungsten or tantalum-doped tungsten are independently profiled with three different SIMS instruments. Their deuterium concentration profiles are compared showing good agreement. In order to assess the validity of the method, the integrated deuterium concentrations in the coatings given by one of the SIMS devices is compared with nuclear reaction analysis (NRA) data. Although in the case of tungsten the agreement between NRA and SIMS is satisfactory, for tantalum-doped tungsten samples the discrepancy is significant because of matrix effect induced by tantalum and differently eroded surface (W + Ta always exposed to plasma, W largely shadowed). A further comparison where the SIMS deuterium concentration is obtained by calibrating the measurements against NRA values is also presented. For the tungsten samples, where no Ta induced matrix effects are present, the two methods are almost equivalent.The results presented show the potential of the method provided that the standards used for the calibration reproduce faithfully the matrix nature of the samples.",
keywords = "fusion energy, tokamaks, plasma, secondary ion mass spectometry, deuterium concentration, depth profile, relative sensitivity factor",
author = "F. Ghezzi and R. Caniello and D. Giubertoni and M. Bersani and Antti Hakola and M. Mayer and V. Rohde and M. Anderle and Team, {ASDEX Upgrade}",
year = "2014",
doi = "10.1016/j.apsusc.2014.06.091",
language = "English",
volume = "315",
pages = "459--466",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",

}

Ghezzi, F, Caniello, R, Giubertoni, D, Bersani, M, Hakola, A, Mayer, M, Rohde, V, Anderle, M & Team, ASDEXU 2014, 'Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry', Applied Surface Science, vol. 315, pp. 459-466. https://doi.org/10.1016/j.apsusc.2014.06.091

Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry. / Ghezzi, F. (Corresponding Author); Caniello, R.; Giubertoni, D.; Bersani, M.; Hakola, Antti; Mayer, M.; Rohde, V.; Anderle, M.; Team, ASDEX Upgrade.

In: Applied Surface Science, Vol. 315, 2014, p. 459-466.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry

AU - Ghezzi, F.

AU - Caniello, R.

AU - Giubertoni, D.

AU - Bersani, M.

AU - Hakola, Antti

AU - Mayer, M.

AU - Rohde, V.

AU - Anderle, M.

AU - Team, ASDEX Upgrade

PY - 2014

Y1 - 2014

N2 - We present the results of a study where secondary ion mass spectrometry (SIMS) has been used to obtain depth profiles of deuterium concentration on plasma facing components of the first wall of the ASDEX Upgrade tokamak. The method uses primary and secondary standards to quantify the amount of deuterium retained. Samples of bulk graphite coated with tungsten or tantalum-doped tungsten are independently profiled with three different SIMS instruments. Their deuterium concentration profiles are compared showing good agreement. In order to assess the validity of the method, the integrated deuterium concentrations in the coatings given by one of the SIMS devices is compared with nuclear reaction analysis (NRA) data. Although in the case of tungsten the agreement between NRA and SIMS is satisfactory, for tantalum-doped tungsten samples the discrepancy is significant because of matrix effect induced by tantalum and differently eroded surface (W + Ta always exposed to plasma, W largely shadowed). A further comparison where the SIMS deuterium concentration is obtained by calibrating the measurements against NRA values is also presented. For the tungsten samples, where no Ta induced matrix effects are present, the two methods are almost equivalent.The results presented show the potential of the method provided that the standards used for the calibration reproduce faithfully the matrix nature of the samples.

AB - We present the results of a study where secondary ion mass spectrometry (SIMS) has been used to obtain depth profiles of deuterium concentration on plasma facing components of the first wall of the ASDEX Upgrade tokamak. The method uses primary and secondary standards to quantify the amount of deuterium retained. Samples of bulk graphite coated with tungsten or tantalum-doped tungsten are independently profiled with three different SIMS instruments. Their deuterium concentration profiles are compared showing good agreement. In order to assess the validity of the method, the integrated deuterium concentrations in the coatings given by one of the SIMS devices is compared with nuclear reaction analysis (NRA) data. Although in the case of tungsten the agreement between NRA and SIMS is satisfactory, for tantalum-doped tungsten samples the discrepancy is significant because of matrix effect induced by tantalum and differently eroded surface (W + Ta always exposed to plasma, W largely shadowed). A further comparison where the SIMS deuterium concentration is obtained by calibrating the measurements against NRA values is also presented. For the tungsten samples, where no Ta induced matrix effects are present, the two methods are almost equivalent.The results presented show the potential of the method provided that the standards used for the calibration reproduce faithfully the matrix nature of the samples.

KW - fusion energy

KW - tokamaks

KW - plasma

KW - secondary ion mass spectometry

KW - deuterium concentration

KW - depth profile

KW - relative sensitivity factor

U2 - 10.1016/j.apsusc.2014.06.091

DO - 10.1016/j.apsusc.2014.06.091

M3 - Article

VL - 315

SP - 459

EP - 466

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -