Deuterium diffusion in silicon-doped diamondlike carbon films

E. Vainonen-Ahlgren (Corresponding Author), T. Ahlgren, Jari Likonen, Sari Lehto, T. Sajavaara, W. Rydman, J. Keinonen, C. Wu

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

Diffusion of deuterium in diamondlike carbon films with different Si contents deposited by a pulsed arc discharge method in deuterium atmosphere was studied. The concentration profiles of D were measured by secondary-ion-mass spectrometry and elastic-recoil-detection techniques. A model is proposed to describe the experimental depth profiles. Diffusion, detrapping, and trapping of D were taken into account in this model. Diffusion coefficients obtained for nontrapped D resulted in activation energies of 1.5±0.2, 0.7±0.2, 0.6±0.2, and 1.2±0.2 eV for samples containing 0, 6, 15, and 33 at.% of Si, respectively.
Original languageEnglish
Article number045406
Number of pages7
JournalPhysical Review B: Condensed Matter and Materials Physics
Volume63
Issue number4
DOIs
Publication statusPublished - 2001
MoE publication typeA1 Journal article-refereed

Fingerprint

Deuterium
Carbon films
Silicon
deuterium
carbon
arc discharges
silicon
profiles
secondary ion mass spectrometry
diffusion coefficient
trapping
activation energy
Secondary ion mass spectrometry
atmospheres
Activation energy

Cite this

Vainonen-Ahlgren, E. ; Ahlgren, T. ; Likonen, Jari ; Lehto, Sari ; Sajavaara, T. ; Rydman, W. ; Keinonen, J. ; Wu, C. / Deuterium diffusion in silicon-doped diamondlike carbon films. In: Physical Review B: Condensed Matter and Materials Physics. 2001 ; Vol. 63, No. 4.
@article{2c0e10994a4f4e17b80d0ef78c0341b6,
title = "Deuterium diffusion in silicon-doped diamondlike carbon films",
abstract = "Diffusion of deuterium in diamondlike carbon films with different Si contents deposited by a pulsed arc discharge method in deuterium atmosphere was studied. The concentration profiles of D were measured by secondary-ion-mass spectrometry and elastic-recoil-detection techniques. A model is proposed to describe the experimental depth profiles. Diffusion, detrapping, and trapping of D were taken into account in this model. Diffusion coefficients obtained for nontrapped D resulted in activation energies of 1.5±0.2, 0.7±0.2, 0.6±0.2, and 1.2±0.2 eV for samples containing 0, 6, 15, and 33 at.{\%} of Si, respectively.",
author = "E. Vainonen-Ahlgren and T. Ahlgren and Jari Likonen and Sari Lehto and T. Sajavaara and W. Rydman and J. Keinonen and C. Wu",
year = "2001",
doi = "10.1103/PhysRevB.63.045406",
language = "English",
volume = "63",
journal = "Physical Review B",
issn = "2469-9950",
publisher = "American Physical Society",
number = "4",

}

Vainonen-Ahlgren, E, Ahlgren, T, Likonen, J, Lehto, S, Sajavaara, T, Rydman, W, Keinonen, J & Wu, C 2001, 'Deuterium diffusion in silicon-doped diamondlike carbon films', Physical Review B: Condensed Matter and Materials Physics, vol. 63, no. 4, 045406. https://doi.org/10.1103/PhysRevB.63.045406

Deuterium diffusion in silicon-doped diamondlike carbon films. / Vainonen-Ahlgren, E. (Corresponding Author); Ahlgren, T.; Likonen, Jari; Lehto, Sari; Sajavaara, T.; Rydman, W.; Keinonen, J.; Wu, C.

In: Physical Review B: Condensed Matter and Materials Physics, Vol. 63, No. 4, 045406, 2001.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Deuterium diffusion in silicon-doped diamondlike carbon films

AU - Vainonen-Ahlgren, E.

AU - Ahlgren, T.

AU - Likonen, Jari

AU - Lehto, Sari

AU - Sajavaara, T.

AU - Rydman, W.

AU - Keinonen, J.

AU - Wu, C.

PY - 2001

Y1 - 2001

N2 - Diffusion of deuterium in diamondlike carbon films with different Si contents deposited by a pulsed arc discharge method in deuterium atmosphere was studied. The concentration profiles of D were measured by secondary-ion-mass spectrometry and elastic-recoil-detection techniques. A model is proposed to describe the experimental depth profiles. Diffusion, detrapping, and trapping of D were taken into account in this model. Diffusion coefficients obtained for nontrapped D resulted in activation energies of 1.5±0.2, 0.7±0.2, 0.6±0.2, and 1.2±0.2 eV for samples containing 0, 6, 15, and 33 at.% of Si, respectively.

AB - Diffusion of deuterium in diamondlike carbon films with different Si contents deposited by a pulsed arc discharge method in deuterium atmosphere was studied. The concentration profiles of D were measured by secondary-ion-mass spectrometry and elastic-recoil-detection techniques. A model is proposed to describe the experimental depth profiles. Diffusion, detrapping, and trapping of D were taken into account in this model. Diffusion coefficients obtained for nontrapped D resulted in activation energies of 1.5±0.2, 0.7±0.2, 0.6±0.2, and 1.2±0.2 eV for samples containing 0, 6, 15, and 33 at.% of Si, respectively.

U2 - 10.1103/PhysRevB.63.045406

DO - 10.1103/PhysRevB.63.045406

M3 - Article

VL - 63

JO - Physical Review B

JF - Physical Review B

SN - 2469-9950

IS - 4

M1 - 045406

ER -