Development and comparison of numerical rounded stripline bend models

Janne Roos; Neslihan Serap Sengör; Tommi Dufva

Development and comparison of numerical rounded stripline bend models

Janne Roos, Neslihan Serap Sengör, Tommi Dufva

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

This paper presents a polynomial model and two artificial neural network models for a rounded stripline bend. These three numerical models are obtained using the data provided by an electromagnetic simulator. The models developed, which have been implemented into APLAC, are verified and compared with simulations.

Original language	English
Title of host publication	Circuit paradigm in the 21st century
Subtitle of host publication	ECCTD '01: proceedings of the 15th European Conference on Circuit Theory and Design
Editors	Veikko Porra
Publisher	Helsinki University of Technology
Pages	313-316
ISBN (Electronic)	951-22-6337-8
Publication status	Published - 2001
MoE publication type	A4 Article in a conference publication
Event	15th European Conference on Circuit Theory and Design, ECCTD 2001 - Espoo, Finland Duration: 28 Aug 2001 → 31 Aug 2001 Conference number: 15

Publication series

Series	Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications
Volume	33:a
ISSN	1455-8440

Conference

Conference	15th European Conference on Circuit Theory and Design, ECCTD 2001
Abbreviated title	ECCTD '01
Country/Territory	Finland
City	Espoo
Period	28/08/01 → 31/08/01

Cite this

Roos, J., Sengör, N. S., & Dufva, T. (2001). Development and comparison of numerical rounded stripline bend models. In V. Porra (Ed.), Circuit paradigm in the 21st century: ECCTD '01: proceedings of the 15th European Conference on Circuit Theory and Design (pp. 313-316). Helsinki University of Technology. Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications Vol. 33:a

Roos, Janne ; Sengör, Neslihan Serap ; Dufva, Tommi. / Development and comparison of numerical rounded stripline bend models. Circuit paradigm in the 21st century: ECCTD '01: proceedings of the 15th European Conference on Circuit Theory and Design. editor / Veikko Porra. Helsinki University of Technology, 2001. pp. 313-316 (Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications, Vol. 33:a).

@inproceedings{3d169c9b1dfa4d2db889d3335e250d44,

title = "Development and comparison of numerical rounded stripline bend models",

abstract = "This paper presents a polynomial model and two artificial neural network models for a rounded stripline bend. These three numerical models are obtained using the data provided by an electromagnetic simulator. The models developed, which have been implemented into APLAC, are verified and compared with simulations.",

author = "Janne Roos and Seng{\"o}r, {Neslihan Serap} and Tommi Dufva",

year = "2001",

language = "English",

series = "Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications",

publisher = "Helsinki University of Technology",

pages = "313--316",

editor = "Veikko Porra",

booktitle = "Circuit paradigm in the 21st century",

address = "Finland",

note = "15th European Conference on Circuit Theory and Design, ECCTD 2001, ECCTD '01 ; Conference date: 28-08-2001 Through 31-08-2001",

}

Roos, J, Sengör, NS & Dufva, T 2001, Development and comparison of numerical rounded stripline bend models. in V Porra (ed.), Circuit paradigm in the 21st century: ECCTD '01: proceedings of the 15th European Conference on Circuit Theory and Design. Helsinki University of Technology, Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications, vol. 33:a, pp. 313-316, 15th European Conference on Circuit Theory and Design, ECCTD 2001, Espoo, Finland, 28/08/01.

Development and comparison of numerical rounded stripline bend models. / Roos, Janne; Sengör, Neslihan Serap; Dufva, Tommi.

Circuit paradigm in the 21st century: ECCTD '01: proceedings of the 15th European Conference on Circuit Theory and Design. ed. / Veikko Porra. Helsinki University of Technology, 2001. p. 313-316 (Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications, Vol. 33:a).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Development and comparison of numerical rounded stripline bend models

AU - Roos, Janne

AU - Sengör, Neslihan Serap

AU - Dufva, Tommi

N1 - Conference code: 15

PY - 2001

Y1 - 2001

N2 - This paper presents a polynomial model and two artificial neural network models for a rounded stripline bend. These three numerical models are obtained using the data provided by an electromagnetic simulator. The models developed, which have been implemented into APLAC, are verified and compared with simulations.

AB - This paper presents a polynomial model and two artificial neural network models for a rounded stripline bend. These three numerical models are obtained using the data provided by an electromagnetic simulator. The models developed, which have been implemented into APLAC, are verified and compared with simulations.

M3 - Conference article in proceedings

T3 - Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications

SP - 313

EP - 316

BT - Circuit paradigm in the 21st century

A2 - Porra, Veikko

PB - Helsinki University of Technology

T2 - 15th European Conference on Circuit Theory and Design, ECCTD 2001

Y2 - 28 August 2001 through 31 August 2001

ER -

Roos J, Sengör NS, Dufva T. Development and comparison of numerical rounded stripline bend models. In Porra V, editor, Circuit paradigm in the 21st century: ECCTD '01: proceedings of the 15th European Conference on Circuit Theory and Design. Helsinki University of Technology. 2001. p. 313-316. (Helsinki University of Technology: Electronic Circuit Design Laboratory. Publications, Vol. 33:a).

Development and comparison of numerical rounded stripline bend models

Abstract

Publication series

Conference

Fingerprint

Cite this