Development of a NIR device for measuring varnish thickness on-line

J. Anduaga, K. Mayora, I. Garmendia, M. Munoz, Pentti Niemelä, Jouni Tornberg, Eero Hietala, F. Manero

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationNear Infrared Spectroscopy
Subtitle of host publicationProceedings of the 11th International Conference
Pages1105-1109
ISBN (Electronic)978-1-906715-23-6
Publication statusPublished - 2003
MoE publication typeA4 Article in a conference publication
Event11th International Conference on Near-Infrared Spectroscopy, NIR 2003 - Córdoba, Spain
Duration: 6 Apr 200311 Apr 2003
Conference number: 11

Conference

Conference11th International Conference on Near-Infrared Spectroscopy, NIR 2003
Abbreviated titleNIR 2003
CountrySpain
CityCórdoba
Period6/04/0311/04/03

Keywords

  • thickness measurement
  • on-line measurement coating

Cite this

Anduaga, J., Mayora, K., Garmendia, I., Munoz, M., Niemelä, P., Tornberg, J., Hietala, E., & Manero, F. (2003). Development of a NIR device for measuring varnish thickness on-line. In Near Infrared Spectroscopy: Proceedings of the 11th International Conference (pp. 1105-1109). [P.8.16] https://www.impopen.com/bdownload.php?code=978-1-906715-23-6_ch201