Development of a NIR device for measuring varnish thickness on-line

J. Anduaga, K. Mayora, I. Garmendia, M. Munoz, Pentti Niemelä, Jouni Tornberg, Eero Hietala, F. Manero

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationNear Infrared Spectroscopy
Subtitle of host publicationProceedings of the 11th International Conference
Pages1105-1109
ISBN (Electronic)978-1-906715-23-6
Publication statusPublished - 2003
MoE publication typeA4 Article in a conference publication
Event11th International Conference on Near-Infrared Spectroscopy, NIR 2003 - Córdoba, Spain
Duration: 6 Apr 200311 Apr 2003
Conference number: 11

Conference

Conference11th International Conference on Near-Infrared Spectroscopy, NIR 2003
Abbreviated titleNIR 2003
CountrySpain
CityCórdoba
Period6/04/0311/04/03

Keywords

  • thickness measurement
  • on-line measurement coating

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