Development of a NIR device for measuring varnish thickness on-line

J. Anduaga, K. Mayora, I. Garmendia, M. Munoz, Pentti Niemelä, Jouni Tornberg, Eero Hietala, F. Manero

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationNear Infrared Spectroscopy
    Subtitle of host publicationProceedings of the 11th International Conference
    Pages1105-1109
    ISBN (Electronic)978-1-906715-23-6
    Publication statusPublished - 2003
    MoE publication typeA4 Article in a conference publication
    Event11th International Conference on Near-Infrared Spectroscopy, NIR 2003 - Córdoba, Spain
    Duration: 6 Apr 200311 Apr 2003
    Conference number: 11

    Conference

    Conference11th International Conference on Near-Infrared Spectroscopy, NIR 2003
    Abbreviated titleNIR 2003
    Country/TerritorySpain
    CityCórdoba
    Period6/04/0311/04/03

    Keywords

    • thickness measurement
    • on-line measurement coating

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