Development of a NIR device for measuring varnish thickness on-line

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Near Infrared Spectroscopy
Subtitle of host publication	Proceedings of the 11th International Conference
Pages	1105-1109
ISBN (Electronic)	978-1-906715-23-6
Publication status	Published - 2003
MoE publication type	A4 Article in a conference publication
Event	11th International Conference on Near-Infrared Spectroscopy, NIR 2003 - Córdoba, Spain Duration: 6 Apr 2003 → 11 Apr 2003 Conference number: 11

Conference	11th International Conference on Near-Infrared Spectroscopy, NIR 2003
Abbreviated title	NIR 2003
Country/Territory	Spain
City	Córdoba
Period	6/04/03 → 11/04/03

Keywords

@inproceedings{1f0123b332114e37b4897d415e6281d4,

title = "Development of a NIR device for measuring varnish thickness on-line",

keywords = "thickness measurement, on-line measurement coating",

author = "J. Anduaga and K. Mayora and I. Garmendia and M. Munoz and Pentti Niemel{\"a} and Jouni Tornberg and Eero Hietala and F. Manero",

year = "2003",

language = "English",

pages = "1105--1109",

booktitle = "Near Infrared Spectroscopy",

note = "11th International Conference on Near-Infrared Spectroscopy, NIR 2003, NIR 2003 ; Conference date: 06-04-2003 Through 11-04-2003",

}

Anduaga, J, Mayora, K, Garmendia, I, Munoz, M, Niemelä, P, Tornberg, J, Hietala, E & Manero, F 2003, Development of a NIR device for measuring varnish thickness on-line. in Near Infrared Spectroscopy: Proceedings of the 11th International Conference., P.8.16, pp. 1105-1109, 11th International Conference on Near-Infrared Spectroscopy, NIR 2003, Córdoba, Spain, 6/04/03. <https://www.impopen.com/bdownload.php?code=978-1-906715-23-6_ch201>

TY - GEN

T1 - Development of a NIR device for measuring varnish thickness on-line

AU - Anduaga, J.

AU - Mayora, K.

AU - Garmendia, I.

AU - Munoz, M.

AU - Niemelä, Pentti

AU - Tornberg, Jouni

AU - Hietala, Eero

AU - Manero, F.

N1 - Conference code: 11

PY - 2003

Y1 - 2003

KW - thickness measurement

KW - on-line measurement coating

M3 - Conference article in proceedings

SP - 1105

EP - 1109

BT - Near Infrared Spectroscopy

T2 - 11th International Conference on Near-Infrared Spectroscopy, NIR 2003

Y2 - 6 April 2003 through 11 April 2003

ER -