Development of an optoelectronic sensor for measuring varnish thickness on-line

Francisco Manero, Javier Anduaga, Kepa Mayora, Izaskun Garmendia, Pentti Niemelä, Eero Hietala, Jouni Tornberg

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationNIR-2003
Subtitle of host publicationStretching the NIR spectrum to the limit
Pages1105-1109
Publication statusPublished - 2004
MoE publication typeA4 Article in a conference publication
Event11th International Conference on Near-Infrared Spectroscopy, NIR 2003 - Córdoba, Spain
Duration: 6 Apr 200311 Apr 2003
Conference number: 11

Conference

Conference11th International Conference on Near-Infrared Spectroscopy, NIR 2003
Abbreviated titleNIR 2003
CountrySpain
CityCórdoba
Period6/04/0311/04/03

Cite this

Manero, F., Anduaga, J., Mayora, K., Garmendia, I., Niemelä, P., Hietala, E., & Tornberg, J. (2004). Development of an optoelectronic sensor for measuring varnish thickness on-line. In NIR-2003: Stretching the NIR spectrum to the limit (pp. 1105-1109)