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Device and method for optical measurement of a target
Jarkko Antila (Inventor)
,
Jussi Tenhunen
(Inventor)
Research output
:
Patent
›
Patent
Overview
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Keyphrases
Optical Measurement
100%
Patent Family
100%
Spectral Range
50%
Diode Laser
50%
Fluorescence Measurement
50%
Radiation Beam
50%
Fabry-Perot Interferometer
50%
Absorbance Measurement
50%
High Spectral Resolution
50%
Sulfur Compounds
50%
Mass Application
50%
Raman Spectrometer
50%
Measurement Path
50%
Low-cost Components
50%
Reflectance Measurement
50%
Point Detector
50%
Raman Signature
50%
Small-sized
50%
INIS
devices
100%
patents
100%
beams
100%
solutions
50%
information
50%
applications
50%
cost
50%
pulses
50%
range
50%
radiations
50%
lasers
50%
irradiation
50%
resolution
50%
fluorescence
50%
spectrometers
50%
fabry-perot interferometer
50%
sulfur compounds
50%
Engineering
Patent Family
100%
Spectral Range
50%
Pass Band
50%
High Spectral Resolution
50%
Fabry Perot
50%
Beam Radiation
50%
Perot Interferometer
50%
Reflectance
50%
Physics
Optical Measurement
100%
Semiconductor Laser
50%
Fabry-Perot Interferometer
50%
Spectrometer
50%
Beams (Radiation)
50%
Reflectance
50%
Sulfur Compounds
50%
Material Science
Optical Measurement
100%
Laser Diode
50%
Interferometer
50%