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Dielectric losses in multi-layer Josephson junction qubits
David Gunnarsson
, Juha-Matti Pirkkalainen
, Jian Li
, Gheorghe Sorin Paraoanu
, Pertti Hakonen
, Mika Sillanpää
,
Mika Prunnila
Aalto University
VTT (former employee or external)
Research output
:
Contribution to journal
›
Article
›
Scientific
›
peer-review
21
Citations (Scopus)
Overview
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Keyphrases
AlOx
25%
Coplanar Waveguide Resonator
25%
Design Decisions
25%
Dielectric
100%
Dielectric Loss
100%
Dielectric Materials
50%
Electric Field (E-field)
25%
Excited State Lifetime
25%
High Frequency Characterization
25%
Josephson Junction
100%
Junction Barrier
25%
Loss Contribution
25%
Material Choice
25%
Multi-layer Process
25%
Phase Qubit
50%
Qubit
100%
Relaxation Time
25%
Si-SiO2
25%
SiNx
50%
Superconducting Qubits
25%
Total Loss
25%
Transmon Qubit
50%
Tunnel Junction
25%
INIS
barriers
14%
comparative evaluations
14%
complement
14%
design
14%
dielectric materials
28%
dielectrics
100%
electric fields
14%
excited states
14%
josephson junctions
100%
layers
100%
lifetime
57%
losses
100%
qubits
100%
relaxation time
14%
removal
28%
resonators
14%
substrates
14%
tools
14%
tunnel junctions
14%
waveguides
14%
Engineering
Dielectric Loss
100%
Dielectrics
85%
Electric Field
14%
Excited State
14%
Josephson Junction
100%
Qubit
100%
Relaxation Time
14%
Resonator
14%
Si Substrate
14%
Silicon Dioxide
14%
Tunnel
14%
Waveguide
14%
Material Science
Dielectric Material
100%
Josephson Junction
100%
Multilayers
100%
Resonator
14%
Waveguide
14%