Abstract
This paper presents the results of the dielectric measurements conducted
on polymer nanocompounds consisting of polypropylene (PP) and
polyhedral oligomeric silsesquioxane (POSS). The material compounds were
analyzed with a scanning electron microscope (SEM) and Raman-atomic
force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown
strength of the material compounds were measured. Relative permittivity,
loss factor and volume resistivity measurements were also conducted on
the material samples. Two types of POSS, octamethyl and isooctyl, were
used in different quantities. The thickness of the samples was
approximately 600 mum. Statistical analysis was applied to the results
to determine the effects of the additive type and amount on the
breakdown strength of polypropylene. The paper discusses the
possibilities and restrictions in order to achieve advantages in high
voltage applications using polyhedral oligomeric silsesquioxanes.
Original language | English |
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Pages (from-to) | 40-51 |
Number of pages | 12 |
Journal | IEEE Transactions on Dielectrics and Electrical Insulation |
Volume | 15 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2008 |
MoE publication type | A1 Journal article-refereed |