Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 40-51 |
| Number of pages | 12 |
| Journal | IEEE Transactions on Dielectrics and Electrical Insulation |
| Volume | 15 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2008 |
| MoE publication type | A1 Journal article-refereed |
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Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds. / Takala, Markus; Karttunen, Mikko; Salovaara, Pauliina; Kortet, Satu; Kannus, Kari; Kalliohaka, Tapio.
In: IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 15, No. 1, 2008, p. 40-51.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds
AU - Takala, Markus
AU - Karttunen, Mikko
AU - Salovaara, Pauliina
AU - Kortet, Satu
AU - Kannus, Kari
AU - Kalliohaka, Tapio
PY - 2008
Y1 - 2008
N2 - This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.
AB - This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.
U2 - 10.1109/T-DEI.2008.4446735
DO - 10.1109/T-DEI.2008.4446735
M3 - Article
VL - 15
SP - 40
EP - 51
JO - IEEE Transactions on Dielectrics and Electrical Insulation
JF - IEEE Transactions on Dielectrics and Electrical Insulation
SN - 1070-9878
IS - 1
ER -