Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds

Markus Takala, Mikko Karttunen, Pauliina Salovaara, Satu Kortet, Kari Kannus, Tapio Kalliohaka

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.
Original languageEnglish
Pages (from-to)40-51
Number of pages12
JournalIEEE Transactions on Dielectrics and Electrical Insulation
Volume15
Issue number1
DOIs
Publication statusPublished - 2008
MoE publication typeA1 Journal article-refereed

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Dielectric properties
Polypropylenes
Lightning
Statistical methods
Microscopes
Permittivity
Electron microscopes
Scanning
Electric potential
Polymers

Cite this

Takala, Markus ; Karttunen, Mikko ; Salovaara, Pauliina ; Kortet, Satu ; Kannus, Kari ; Kalliohaka, Tapio. / Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds. In: IEEE Transactions on Dielectrics and Electrical Insulation. 2008 ; Vol. 15, No. 1. pp. 40-51.
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abstract = "This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.",
author = "Markus Takala and Mikko Karttunen and Pauliina Salovaara and Satu Kortet and Kari Kannus and Tapio Kalliohaka",
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Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds. / Takala, Markus; Karttunen, Mikko; Salovaara, Pauliina; Kortet, Satu; Kannus, Kari; Kalliohaka, Tapio.

In: IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 15, No. 1, 2008, p. 40-51.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds

AU - Takala, Markus

AU - Karttunen, Mikko

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AU - Kannus, Kari

AU - Kalliohaka, Tapio

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AB - This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.

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