Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds

Markus Takala; Mikko Karttunen; Pauliina Salovaara; Satu Kortet; Kari Kannus; Tapio Kalliohaka

doi:10.1109/T-DEI.2008.4446735

Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds

Markus Takala, Mikko Karttunen, Pauliina Salovaara, Satu Kortet, Kari Kannus, Tapio Kalliohaka

Research output: Contribution to journal › Article › Scientific › peer-review

46 Citations (Scopus)

Abstract

This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.

Original language	English
Pages (from-to)	40-51
Number of pages	12
Journal	IEEE Transactions on Dielectrics and Electrical Insulation
Volume	15
Issue number	1
DOIs	https://doi.org/10.1109/T-DEI.2008.4446735
Publication status	Published - 2008
MoE publication type	A1 Journal article-refereed

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title = "Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds",

abstract = "This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.",

author = "Markus Takala and Mikko Karttunen and Pauliina Salovaara and Satu Kortet and Kari Kannus and Tapio Kalliohaka",

year = "2008",

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language = "English",

volume = "15",

pages = "40--51",

journal = "IEEE Transactions on Dielectrics and Electrical Insulation",

issn = "1070-9878",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

number = "1",

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Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds. / Takala, Markus; Karttunen, Mikko; Salovaara, Pauliina; Kortet, Satu; Kannus, Kari; Kalliohaka, Tapio.

In: IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 15, No. 1, 2008, p. 40-51.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Dielectric properties of nanostructured polypropylene-polyhedral oligomeric silsesquioxane compounds

AU - Takala, Markus

AU - Karttunen, Mikko

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AU - Kannus, Kari

AU - Kalliohaka, Tapio

PY - 2008

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AB - This paper presents the results of the dielectric measurements conducted on polymer nanocompounds consisting of polypropylene (PP) and polyhedral oligomeric silsesquioxane (POSS). The material compounds were analyzed with a scanning electron microscope (SEM) and Raman-atomic force microscope (Raman-AFM). Ac and lightning impulse (LI) breakdown strength of the material compounds were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, octamethyl and isooctyl, were used in different quantities. The thickness of the samples was approximately 600 mum. Statistical analysis was applied to the results to determine the effects of the additive type and amount on the breakdown strength of polypropylene. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.

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DO - 10.1109/T-DEI.2008.4446735

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JF - IEEE Transactions on Dielectrics and Electrical Insulation

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