Differential Bloch oscillating transistor pair

J. Sarkar; A. Puska; Juha Hassel; P.J. Hakonen

doi:10.1088/0953-2048/26/6/065009

Differential Bloch oscillating transistor pair

J. Sarkar (Corresponding Author), A. Puska, Juha Hassel, P.J. Hakonen

Research output: Contribution to journal › Article › Scientific › peer-review

2 Citations (Scopus)

Abstract

We examine a Bloch oscillating transistor pair as a differential stage for cryogenic low-noise measurements. Using two oppositely biased, nearly symmetric Bloch oscillating transistors, we measured the sum and difference signals in the current gain and transconductance modes while changing the common mode signal, either voltage or current. From the common mode rejection ratio we find values ~20 dB even under non-optimal conditions. We also characterize the noise properties and obtain excellent noise performance for measurements having source impedances in the MΩ range.

Original language	English
Article number	065009
Number of pages	4
Journal	Superconductor Science and Technology
Volume	26
Issue number	6
DOIs	https://doi.org/10.1088/0953-2048/26/6/065009
Publication status	Published - 2013
MoE publication type	A1 Journal article-refereed

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Sarkar, J., Puska, A., Hassel, J., & Hakonen, P. J. (2013). Differential Bloch oscillating transistor pair. Superconductor Science and Technology, 26(6), [065009]. https://doi.org/10.1088/0953-2048/26/6/065009

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AU - Hakonen, P.J.

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N2 - We examine a Bloch oscillating transistor pair as a differential stage for cryogenic low-noise measurements. Using two oppositely biased, nearly symmetric Bloch oscillating transistors, we measured the sum and difference signals in the current gain and transconductance modes while changing the common mode signal, either voltage or current. From the common mode rejection ratio we find values ~20 dB even under non-optimal conditions. We also characterize the noise properties and obtain excellent noise performance for measurements having source impedances in the MΩ range.

AB - We examine a Bloch oscillating transistor pair as a differential stage for cryogenic low-noise measurements. Using two oppositely biased, nearly symmetric Bloch oscillating transistors, we measured the sum and difference signals in the current gain and transconductance modes while changing the common mode signal, either voltage or current. From the common mode rejection ratio we find values ~20 dB even under non-optimal conditions. We also characterize the noise properties and obtain excellent noise performance for measurements having source impedances in the MΩ range.

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DO - 10.1088/0953-2048/26/6/065009

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Access to Document

10.1088/0953-2048/26/6/065009