Diffusion of arsenic in Germanium

Jari Likonen; E. Vainonen-Ahlgren; T. Ahlgren; Sari Lehto

Diffusion of arsenic in Germanium

Jari Likonen, E. Vainonen-Ahlgren, T. Ahlgren, Sari Lehto

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Secondary ion mass spectrometry SIMS XII
Subtitle of host publication	Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry
Editors	A. Benninghoven, P. Bertrand, H.-N. Migeon
Place of Publication	Amsterdam
Publisher	Elsevier
Pages	685-688
ISBN (Print)	978-0-444-50323-7
Publication status	Published - 2000
MoE publication type	A4 Article in a conference publication
Event	12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII - Brussels, Belgium Duration: 5 Sept 1999 → 11 Sept 1999

Conference

Conference	12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII
Country/Territory	Belgium
City	Brussels
Period	5/09/99 → 11/09/99

Cite this

@inproceedings{630196ba121d4fa69b6f32e9d9d60613,

title = "Diffusion of arsenic in Germanium",

author = "Jari Likonen and E. Vainonen-Ahlgren and T. Ahlgren and Sari Lehto",

year = "2000",

language = "English",

isbn = "978-0-444-50323-7",

pages = "685--688",

editor = "A. Benninghoven and P. Bertrand and H.-N. Migeon",

booktitle = "Secondary ion mass spectrometry SIMS XII",

publisher = "Elsevier",

address = "Netherlands",

note = "12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII ; Conference date: 05-09-1999 Through 11-09-1999",

}

Likonen, J, Vainonen-Ahlgren, E, Ahlgren, T & Lehto, S 2000, Diffusion of arsenic in Germanium. in A Benninghoven, P Bertrand & H-N Migeon (eds), Secondary ion mass spectrometry SIMS XII: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry. Elsevier, Amsterdam, pp. 685-688, 12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII, Brussels, Belgium, 5/09/99.

Diffusion of arsenic in Germanium. / Likonen, Jari; Vainonen-Ahlgren, E.; Ahlgren, T. et al.
Secondary ion mass spectrometry SIMS XII: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry. ed. / A. Benninghoven; P. Bertrand; H.-N. Migeon. Amsterdam: Elsevier, 2000. p. 685-688.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Diffusion of arsenic in Germanium

AU - Likonen, Jari

AU - Vainonen-Ahlgren, E.

AU - Ahlgren, T.

AU - Lehto, Sari

PY - 2000

Y1 - 2000

M3 - Conference article in proceedings

SN - 978-0-444-50323-7

SP - 685

EP - 688

BT - Secondary ion mass spectrometry SIMS XII

A2 - Benninghoven, A.

A2 - Bertrand, P.

A2 - Migeon, H.-N.

PB - Elsevier

CY - Amsterdam

T2 - 12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII

Y2 - 5 September 1999 through 11 September 1999

ER -