Dimensional measurement of plate products using a novel moire system

Jussi Paakkari, Heikki Ailisto

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review


    In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.

    Original languageEnglish
    Title of host publicationThree-Dimensional Imaging, Optical Metrology, and Inspection IV
    Number of pages11
    Publication statusPublished - 1 Dec 1998
    MoE publication typeA4 Article in a conference publication
    EventThree-Dimensional Imaging, Optical Metrology, and Inspection IV - Boston, United States
    Duration: 1 Nov 19986 Nov 1998

    Publication series

    SeriesProceedings of SPIE


    ConferenceThree-Dimensional Imaging, Optical Metrology, and Inspection IV
    Country/TerritoryUnited States


    Dive into the research topics of 'Dimensional measurement of plate products using a novel moire system'. Together they form a unique fingerprint.

    Cite this