Dimensional measurement of plate products using a novel moire system

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.

Original languageEnglish
Title of host publicationThree-Dimensional Imaging, Optical Metrology, and Inspection IV
Pages2-12
Number of pages11
DOIs
Publication statusPublished - 1 Dec 1998
MoE publication typeA4 Article in a conference publication
EventThree-Dimensional Imaging, Optical Metrology, and Inspection IV - Boston, United States
Duration: 1 Nov 19986 Nov 1998

Publication series

SeriesProceedings of SPIE
Volume3520
ISSN0277-786X

Conference

ConferenceThree-Dimensional Imaging, Optical Metrology, and Inspection IV
CountryUnited States
CityBoston
Period1/11/986/11/98

Fingerprint

dimensional measurement
flatness
products
projection
mounting
Mountings
marking
installing
Surface properties
textures
Textures
Impurities
impurities
Costs

Cite this

Paakkari, J., & Ailisto, H. (1998). Dimensional measurement of plate products using a novel moire system. In Three-Dimensional Imaging, Optical Metrology, and Inspection IV (pp. 2-12). Proceedings of SPIE, Vol.. 3520 https://doi.org/10.1117/12.334321
Paakkari, Jussi ; Ailisto, Heikki. / Dimensional measurement of plate products using a novel moire system. Three-Dimensional Imaging, Optical Metrology, and Inspection IV . 1998. pp. 2-12 (Proceedings of SPIE, Vol. 3520).
@inproceedings{4bd07b68c77444e18a07714febaa7452,
title = "Dimensional measurement of plate products using a novel moire system",
abstract = "In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.",
author = "Jussi Paakkari and Heikki Ailisto",
year = "1998",
month = "12",
day = "1",
doi = "10.1117/12.334321",
language = "English",
series = "Proceedings of SPIE",
publisher = "International Society for Optics and Photonics SPIE",
pages = "2--12",
booktitle = "Three-Dimensional Imaging, Optical Metrology, and Inspection IV",

}

Paakkari, J & Ailisto, H 1998, Dimensional measurement of plate products using a novel moire system. in Three-Dimensional Imaging, Optical Metrology, and Inspection IV . Proceedings of SPIE, vol. 3520, pp. 2-12, Three-Dimensional Imaging, Optical Metrology, and Inspection IV , Boston, United States, 1/11/98. https://doi.org/10.1117/12.334321

Dimensional measurement of plate products using a novel moire system. / Paakkari, Jussi; Ailisto, Heikki.

Three-Dimensional Imaging, Optical Metrology, and Inspection IV . 1998. p. 2-12 (Proceedings of SPIE, Vol. 3520).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

TY - GEN

T1 - Dimensional measurement of plate products using a novel moire system

AU - Paakkari, Jussi

AU - Ailisto, Heikki

PY - 1998/12/1

Y1 - 1998/12/1

N2 - In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.

AB - In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.

UR - http://www.scopus.com/inward/record.url?scp=0032274225&partnerID=8YFLogxK

U2 - 10.1117/12.334321

DO - 10.1117/12.334321

M3 - Conference article in proceedings

AN - SCOPUS:0032274225

T3 - Proceedings of SPIE

SP - 2

EP - 12

BT - Three-Dimensional Imaging, Optical Metrology, and Inspection IV

ER -

Paakkari J, Ailisto H. Dimensional measurement of plate products using a novel moire system. In Three-Dimensional Imaging, Optical Metrology, and Inspection IV . 1998. p. 2-12. (Proceedings of SPIE, Vol. 3520). https://doi.org/10.1117/12.334321