Abstract
In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.
| Original language | English |
|---|---|
| Title of host publication | Three-Dimensional Imaging, Optical Metrology, and Inspection IV |
| Pages | 2-12 |
| Number of pages | 11 |
| DOIs | |
| Publication status | Published - 1 Dec 1998 |
| MoE publication type | A4 Article in a conference publication |
| Event | Three-Dimensional Imaging, Optical Metrology, and Inspection IV - Boston, United States Duration: 1 Nov 1998 → 6 Nov 1998 |
Publication series
| Name | Proceedings of SPIE |
|---|---|
| Publisher | International Society for Optics and Photonics SPIE |
| Volume | 3520 |
| ISSN (Print) | 0277-786X |
Conference
| Conference | Three-Dimensional Imaging, Optical Metrology, and Inspection IV |
|---|---|
| Country | United States |
| City | Boston |
| Period | 1/11/98 → 6/11/98 |
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Dimensional measurement of plate products using a novel moire system. / Paakkari, Jussi; Ailisto, Heikki.
Three-Dimensional Imaging, Optical Metrology, and Inspection IV . 1998. p. 2-12 (Proceedings of SPIE, Vol. 3520).Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
TY - GEN
T1 - Dimensional measurement of plate products using a novel moire system
AU - Paakkari, Jussi
AU - Ailisto, Heikki
PY - 1998/12/1
Y1 - 1998/12/1
N2 - In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.
AB - In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.
UR - http://www.scopus.com/inward/record.url?scp=0032274225&partnerID=8YFLogxK
U2 - 10.1117/12.334321
DO - 10.1117/12.334321
M3 - Conference article in proceedings
T3 - Proceedings of SPIE
SP - 2
EP - 12
BT - Three-Dimensional Imaging, Optical Metrology, and Inspection IV
ER -