@inproceedings{4bd07b68c77444e18a07714febaa7452,
title = "Dimensional measurement of plate products using a novel moire system",
abstract = "In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.",
author = "Jussi Paakkari and Heikki Ailisto",
year = "1998",
month = dec,
day = "1",
doi = "10.1117/12.334321",
language = "English",
series = "Proceedings of SPIE",
publisher = "International Society for Optics and Photonics SPIE",
pages = "2--12",
booktitle = "Three-Dimensional Imaging, Optical Metrology, and Inspection IV",
note = "Three-Dimensional Imaging, Optical Metrology, and Inspection IV ; Conference date: 01-11-1998 Through 06-11-1998",
}