Direct measurement of spurious mode properties in thin film BAW resonator

K. Kokkonen, Tuomas Pensala, Johanna Meltaus, M. Kaivola

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Fingerprint

    Dive into the research topics of 'Direct measurement of spurious mode properties in thin film BAW resonator'. Together they form a unique fingerprint.

    Physics & Astronomy