DNA origami structures as calibration standards for nanometrology

Virpi Korpelainen; Veikko Linko; Jeremias Seppä; Antti Lassila; Mauri A. Kostiainen

doi:10.1088/1361-6501/28/3/034001

DNA origami structures as calibration standards for nanometrology

Virpi Korpelainen (Corresponding Author), Veikko Linko, Jeremias Seppä, Antti Lassila, Mauri A. Kostiainen

Aalto University

Research output: Contribution to journal › Article › Scientific › peer-review

10 Citations (Scopus)

Abstract

In this work we have studied the feasibility of DNA origami nanostructures as dimensional calibration standards for atomic force microscopes (AFMs) at the nanometre scale. The stability of the structures and repeatability of the measurement have been studied, and the applicability for calibration is discussed. A cross-like Seeman tile (ST) was selected for the studies and it was found suitable for repeatable calibration of AFMs. The height of the first height step of the ST was 2.0 nm. Expanded standard uncertainty (k = 2) of the measurement U _c was 0.2 nm. The width of the ST was 88 nm and width of its arm was 28 nm with U _c = 3 nm. In addition, prepared dry samples were found out to be stable at least for 12 months.

Original language	English
Article number	034001
Number of pages	6
Journal	Measurement Science and Technology
Volume	28
Issue number	3
DOIs	https://doi.org/10.1088/1361-6501/28/3/034001
Publication status	Published - 2017
MoE publication type	A1 Journal article-refereed

Keywords

atomic force microscopy
DNA nanotechnology
DNA origami
self-assembly
calibration

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@article{c3f3bf04f7364e95997935aa0b1a4937,

title = "DNA origami structures as calibration standards for nanometrology",

abstract = "In this work we have studied the feasibility of DNA origami nanostructures as dimensional calibration standards for atomic force microscopes (AFMs) at the nanometre scale. The stability of the structures and repeatability of the measurement have been studied, and the applicability for calibration is discussed. A cross-like Seeman tile (ST) was selected for the studies and it was found suitable for repeatable calibration of AFMs. The height of the first height step of the ST was 2.0 nm. Expanded standard uncertainty (k = 2) of the measurement U c was 0.2 nm. The width of the ST was 88 nm and width of its arm was 28 nm with U c = 3 nm. In addition, prepared dry samples were found out to be stable at least for 12 months.",

keywords = "atomic force microscopy, DNA nanotechnology, DNA origami, self-assembly, calibration",

author = "Virpi Korpelainen and Veikko Linko and Jeremias Sepp{\"a} and Antti Lassila and Kostiainen, {Mauri A.}",

note = "HUO: 1361-6501",

year = "2017",

doi = "10.1088/1361-6501/28/3/034001",

language = "English",

volume = "28",

journal = "Measurement Science and Technology",

issn = "0957-0233",

publisher = "Institute of Physics IOP",

number = "3",

}

TY - JOUR

T1 - DNA origami structures as calibration standards for nanometrology

AU - Korpelainen, Virpi

AU - Linko, Veikko

AU - Seppä, Jeremias

AU - Lassila, Antti

AU - Kostiainen, Mauri A.

N1 - HUO: 1361-6501

PY - 2017

Y1 - 2017

N2 - In this work we have studied the feasibility of DNA origami nanostructures as dimensional calibration standards for atomic force microscopes (AFMs) at the nanometre scale. The stability of the structures and repeatability of the measurement have been studied, and the applicability for calibration is discussed. A cross-like Seeman tile (ST) was selected for the studies and it was found suitable for repeatable calibration of AFMs. The height of the first height step of the ST was 2.0 nm. Expanded standard uncertainty (k = 2) of the measurement U c was 0.2 nm. The width of the ST was 88 nm and width of its arm was 28 nm with U c = 3 nm. In addition, prepared dry samples were found out to be stable at least for 12 months.

AB - In this work we have studied the feasibility of DNA origami nanostructures as dimensional calibration standards for atomic force microscopes (AFMs) at the nanometre scale. The stability of the structures and repeatability of the measurement have been studied, and the applicability for calibration is discussed. A cross-like Seeman tile (ST) was selected for the studies and it was found suitable for repeatable calibration of AFMs. The height of the first height step of the ST was 2.0 nm. Expanded standard uncertainty (k = 2) of the measurement U c was 0.2 nm. The width of the ST was 88 nm and width of its arm was 28 nm with U c = 3 nm. In addition, prepared dry samples were found out to be stable at least for 12 months.

KW - atomic force microscopy

KW - DNA nanotechnology

KW - DNA origami

KW - self-assembly

KW - calibration

UR - http://www.scopus.com/inward/record.url?scp=85012078069&partnerID=8YFLogxK

U2 - 10.1088/1361-6501/28/3/034001

DO - 10.1088/1361-6501/28/3/034001

M3 - Article

SN - 0957-0233

VL - 28

JO - Measurement Science and Technology

JF - Measurement Science and Technology

IS - 3

M1 - 034001

ER -

DNA origami structures as calibration standards for nanometrology

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