DNA origami structures as calibration standards for nanometrology

Virpi Korpelainen (Corresponding Author), Veikko Linko, Jeremias Seppä, Antti Lassila, Mauri A. Kostiainen

    Research output: Contribution to journalArticleScientificpeer-review

    8 Citations (Scopus)

    Abstract

    In this work we have studied the feasibility of DNA origami nanostructures as dimensional calibration standards for atomic force microscopes (AFMs) at the nanometre scale. The stability of the structures and repeatability of the measurement have been studied, and the applicability for calibration is discussed. A cross-like Seeman tile (ST) was selected for the studies and it was found suitable for repeatable calibration of AFMs. The height of the first height step of the ST was 2.0 nm. Expanded standard uncertainty (k = 2) of the measurement U c was 0.2 nm. The width of the ST was 88 nm and width of its arm was 28 nm with U c = 3 nm. In addition, prepared dry samples were found out to be stable at least for 12 months.
    Original languageEnglish
    Article number034001
    Number of pages6
    JournalMeasurement Science and Technology
    Volume28
    Issue number3
    DOIs
    Publication statusPublished - 2017
    MoE publication typeA1 Journal article-refereed

    Keywords

    • atomic force microscopy
    • DNA nanotechnology
    • DNA origami
    • self-assembly
    • calibration

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