DNA origami structures as calibration standards for nanometrology

Virpi Korpelainen (Corresponding Author), Veikko Linko, Jeremias Seppä, Antti Lassila, Mauri A. Kostiainen

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Abstract

In this work we have studied the feasibility of DNA origami nanostructures as dimensional calibration standards for atomic force microscopes (AFMs) at the nanometre scale. The stability of the structures and repeatability of the measurement have been studied, and the applicability for calibration is discussed. A cross-like Seeman tile (ST) was selected for the studies and it was found suitable for repeatable calibration of AFMs. The height of the first height step of the ST was 2.0 nm. Expanded standard uncertainty (k = 2) of the measurement U c was 0.2 nm. The width of the ST was 88 nm and width of its arm was 28 nm with U c = 3 nm. In addition, prepared dry samples were found out to be stable at least for 12 months.
Original languageEnglish
Article number034001
Number of pages6
JournalMeasurement Science and Technology
Volume28
Issue number3
DOIs
Publication statusPublished - 2017
MoE publication typeA1 Journal article-refereed

Fingerprint

Nanometrology
tiles
Tile
Calibration
DNA
Atomic Force Microscope
deoxyribonucleic acid
Microscopes
microscopes
Repeatability
Nanostructures
Uncertainty
Standards

Keywords

  • atomic force microscopy
  • DNA nanotechnology
  • DNA origami
  • self-assembly
  • calibration

Cite this

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DNA origami structures as calibration standards for nanometrology. / Korpelainen, Virpi (Corresponding Author); Linko, Veikko; Seppä, Jeremias; Lassila, Antti; Kostiainen, Mauri A.

In: Measurement Science and Technology, Vol. 28, No. 3, 034001, 2017.

Research output: Contribution to journalArticleScientificpeer-review

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AU - Korpelainen, Virpi

AU - Linko, Veikko

AU - Seppä, Jeremias

AU - Lassila, Antti

AU - Kostiainen, Mauri A.

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