Double-Shielded Sample Stage for Single-Electron Devices

Antti Manninen, Antti Kemppinen, Emma Mykkänen, H. Koivula, Ossi Hahtela, Ville F. Maisi, S.V. Lotkhov, A.B. Zorin, O-P. Saira, J.P. Pekola

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publication2012 Conference on Precision electromagnetic Measurements, CPEM 2012
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages704-705
    ISBN (Electronic)978-1-4673-0442-9
    ISBN (Print)978-1-4673-0439-9
    DOIs
    Publication statusPublished - 2012
    MoE publication typeA4 Article in a conference publication
    Event2012 Conference on Precision Electromagnetic Measurements, CPEM 2012 - Washington, DC, United States
    Duration: 1 Jul 20126 Jul 2012

    Conference

    Conference2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
    Abbreviated titleCPEM
    CountryUnited States
    CityWashington, DC
    Period1/07/126/07/12

    Keywords

    • electromagnetic shielding
    • filtering
    • single electron devices
    • charge pumps
    • nanoscale devices
    • metrology

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