Double-Shielded Sample Stage for Single-Electron Devices

Antti Manninen, Antti Kemppinen, Emma Mykkänen, H. Koivula, Ossi Hahtela, Ville F. Maisi, S.V. Lotkhov, A.B. Zorin, O-P. Saira, J.P. Pekola

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publication2012 Conference on Precision electromagnetic Measurements, CPEM 2012
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages704-705
ISBN (Electronic)978-1-4673-0442-9
ISBN (Print)978-1-4673-0439-9
DOIs
Publication statusPublished - 2012
MoE publication typeA4 Article in a conference publication
Event2012 Conference on Precision Electromagnetic Measurements, CPEM 2012 - Washington, DC, United States
Duration: 1 Jul 20126 Jul 2012

Conference

Conference2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
Abbreviated titleCPEM
CountryUnited States
CityWashington, DC
Period1/07/126/07/12

Keywords

  • electromagnetic shielding
  • filtering
  • single electron devices
  • charge pumps
  • nanoscale devices
  • metrology

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