Double-Shielded Sample Stage for Single-Electron Devices

Antti Manninen; Antti Kemppinen; Emma Mykkänen; H. Koivula; Ossi Hahtela; Ville F. Maisi; S.V. Lotkhov; A.B. Zorin; O-P. Saira; J.P. Pekola

doi:10.1109/CPEM.2012.6251124

Double-Shielded Sample Stage for Single-Electron Devices

Antti Manninen, Antti Kemppinen, Emma Mykkänen, H. Koivula, Ossi Hahtela, Ville F. Maisi, S.V. Lotkhov, A.B. Zorin, O-P. Saira, J.P. Pekola

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	2012 Conference on Precision electromagnetic Measurements, CPEM 2012
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	704-705
ISBN (Electronic)	978-1-4673-0442-9
ISBN (Print)	978-1-4673-0439-9
DOIs	https://doi.org/10.1109/CPEM.2012.6251124
Publication status	Published - 2012
MoE publication type	A4 Article in a conference publication
Event	2012 Conference on Precision Electromagnetic Measurements, CPEM 2012 - Washington, DC, United States Duration: 1 Jul 2012 → 6 Jul 2012

Conference

Conference	2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
Abbreviated title	CPEM
Country/Territory	United States
City	Washington, DC
Period	1/07/12 → 6/07/12

Keywords

electromagnetic shielding
filtering
single electron devices
charge pumps
nanoscale devices
metrology

Access to Document

10.1109/CPEM.2012.6251124

Cite this

Manninen, A., Kemppinen, A., Mykkänen, E., Koivula, H., Hahtela, O., Maisi, V. F., Lotkhov, S. V., Zorin, A. B., Saira, O.-P., & Pekola, J. P. (2012). Double-Shielded Sample Stage for Single-Electron Devices. In 2012 Conference on Precision electromagnetic Measurements, CPEM 2012 (pp. 704-705). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/CPEM.2012.6251124

@inproceedings{30db7366348d4dee944f5e6d440e629d,

title = "Double-Shielded Sample Stage for Single-Electron Devices",

keywords = "electromagnetic shielding, filtering, single electron devices, charge pumps, nanoscale devices, metrology",

author = "Antti Manninen and Antti Kemppinen and Emma Mykk{\"a}nen and H. Koivula and Ossi Hahtela and Maisi, {Ville F.} and S.V. Lotkhov and A.B. Zorin and O-P. Saira and J.P. Pekola",

year = "2012",

doi = "10.1109/CPEM.2012.6251124",

language = "English",

isbn = "978-1-4673-0439-9",

pages = "704--705",

booktitle = "2012 Conference on Precision electromagnetic Measurements, CPEM 2012",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "2012 Conference on Precision Electromagnetic Measurements, CPEM 2012, CPEM ; Conference date: 01-07-2012 Through 06-07-2012",

}

Manninen, A , Kemppinen, A , Mykkänen, E, Koivula, H, Hahtela, O, Maisi, VF, Lotkhov, SV, Zorin, AB, Saira, O-P & Pekola, JP 2012, Double-Shielded Sample Stage for Single-Electron Devices. in 2012 Conference on Precision electromagnetic Measurements, CPEM 2012. IEEE Institute of Electrical and Electronic Engineers, pp. 704-705, 2012 Conference on Precision Electromagnetic Measurements, CPEM 2012, Washington, DC, United States, 1/07/12. https://doi.org/10.1109/CPEM.2012.6251124

Double-Shielded Sample Stage for Single-Electron Devices. / Manninen, Antti ; Kemppinen, Antti ; Mykkänen, Emma et al.
2012 Conference on Precision electromagnetic Measurements, CPEM 2012. IEEE Institute of Electrical and Electronic Engineers, 2012. p. 704-705.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Double-Shielded Sample Stage for Single-Electron Devices

AU - Manninen, Antti

AU - Kemppinen, Antti

AU - Mykkänen, Emma

AU - Koivula, H.

AU - Hahtela, Ossi

AU - Maisi, Ville F.

AU - Lotkhov, S.V.

AU - Zorin, A.B.

AU - Saira, O-P.

AU - Pekola, J.P.

PY - 2012

Y1 - 2012

KW - electromagnetic shielding

KW - filtering

KW - single electron devices

KW - charge pumps

KW - nanoscale devices

KW - metrology

U2 - 10.1109/CPEM.2012.6251124

DO - 10.1109/CPEM.2012.6251124

M3 - Conference article in proceedings

SN - 978-1-4673-0439-9

SP - 704

EP - 705

BT - 2012 Conference on Precision electromagnetic Measurements, CPEM 2012

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 2012 Conference on Precision Electromagnetic Measurements, CPEM 2012

Y2 - 1 July 2012 through 6 July 2012

ER -