E-band Active Transmitarray Characterization Using Selective Element Illumination

Jan H.S. Bergman; Eero Pietiläinen; Juha Ala-Laurinaho; Antti Lamminen; Jehki Pusa; Mikko Kaunisto; Jussi Säily; Ville Viikari

doi:10.23919/EuCAP63536.2025.10999794

E-band Active Transmitarray Characterization Using Selective Element Illumination

Jan H.S. Bergman, Eero Pietiläinen, Juha Ala-Laurinaho, Antti Lamminen, Jehki Pusa, Mikko Kaunisto, Jussi Säily, Ville Viikari

Aalto University

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

A transmitarray (TA)-characterization method utilizing selective element illumination (SEI) using a metallic mask to isolate individual elements is described. This method allows for the effective turning off of all other elements while having minimal effect on the illumination of the desired element. The impact of the mask is analyzed through the electric fields on the aperture of the TA and the measured radiation patterns with and without the mask present. Compared to other element-isolation methods, using a mask preserves more detail in the embedded element pattern (EEP), better representing the true performance of the element as a part of the TA.

Original language	English
Title of host publication	EuCAP 2025 - 19th European Conference on Antennas and Propagation
Publisher	IEEE Institute of Electrical and Electronic Engineers
ISBN (Electronic)	9788831299107
DOIs	https://doi.org/10.23919/EuCAP63536.2025.10999794
Publication status	Published - 2025
MoE publication type	A4 Article in a conference publication
Event	19th European Conference on Antennas and Propagation, EuCAP 2025 - Stockholm, Sweden Duration: 30 Mar 2025 → 4 Apr 2025

Conference

Conference	19th European Conference on Antennas and Propagation, EuCAP 2025
Country/Territory	Sweden
City	Stockholm
Period	30/03/25 → 4/04/25

Funding

This work was supported by Business Finland through RF Sampo project (3071/31/2021). Research infrastructure provided by Aalto Electronics-ICT was utilized for this work.

Keywords

Antenna arrays
antenna diagnostics
antenna measurements
transmitarrays

Access to Document

10.23919/EuCAP63536.2025.10999794

Cite this

Bergman, J. H. S., Pietiläinen, E., Ala-Laurinaho, J., Lamminen, A., Pusa, J., Kaunisto, M., Säily, J., & Viikari, V. (2025). E-band Active Transmitarray Characterization Using Selective Element Illumination. In EuCAP 2025 - 19th European Conference on Antennas and Propagation IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.23919/EuCAP63536.2025.10999794

@inproceedings{7f9fee36be7f47e3a93e7749aaf57cfd,

title = "E-band Active Transmitarray Characterization Using Selective Element Illumination",

abstract = "A transmitarray (TA)-characterization method utilizing selective element illumination (SEI) using a metallic mask to isolate individual elements is described. This method allows for the effective turning off of all other elements while having minimal effect on the illumination of the desired element. The impact of the mask is analyzed through the electric fields on the aperture of the TA and the measured radiation patterns with and without the mask present. Compared to other element-isolation methods, using a mask preserves more detail in the embedded element pattern (EEP), better representing the true performance of the element as a part of the TA.",

keywords = "Antenna arrays, antenna diagnostics, antenna measurements, transmitarrays",

author = "Bergman, {Jan H.S.} and Eero Pietil{\"a}inen and Juha Ala-Laurinaho and Antti Lamminen and Jehki Pusa and Mikko Kaunisto and Jussi S{\"a}ily and Ville Viikari",

year = "2025",

doi = "10.23919/EuCAP63536.2025.10999794",

language = "English",

booktitle = "EuCAP 2025 - 19th European Conference on Antennas and Propagation",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "19th European Conference on Antennas and Propagation, EuCAP 2025 ; Conference date: 30-03-2025 Through 04-04-2025",

}

Bergman, JHS, Pietiläinen, E, Ala-Laurinaho, J, Lamminen, A, Pusa, J, Kaunisto, M , Säily, J & Viikari, V 2025, E-band Active Transmitarray Characterization Using Selective Element Illumination. in EuCAP 2025 - 19th European Conference on Antennas and Propagation. IEEE Institute of Electrical and Electronic Engineers, 19th European Conference on Antennas and Propagation, EuCAP 2025, Stockholm, Sweden, 30/03/25. https://doi.org/10.23919/EuCAP63536.2025.10999794

E-band Active Transmitarray Characterization Using Selective Element Illumination. / Bergman, Jan H.S.; Pietiläinen, Eero; Ala-Laurinaho, Juha et al.
EuCAP 2025 - 19th European Conference on Antennas and Propagation. IEEE Institute of Electrical and Electronic Engineers, 2025.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - E-band Active Transmitarray Characterization Using Selective Element Illumination

AU - Bergman, Jan H.S.

AU - Pietiläinen, Eero

AU - Ala-Laurinaho, Juha

AU - Lamminen, Antti

AU - Pusa, Jehki

AU - Kaunisto, Mikko

AU - Säily, Jussi

AU - Viikari, Ville

PY - 2025

Y1 - 2025

N2 - A transmitarray (TA)-characterization method utilizing selective element illumination (SEI) using a metallic mask to isolate individual elements is described. This method allows for the effective turning off of all other elements while having minimal effect on the illumination of the desired element. The impact of the mask is analyzed through the electric fields on the aperture of the TA and the measured radiation patterns with and without the mask present. Compared to other element-isolation methods, using a mask preserves more detail in the embedded element pattern (EEP), better representing the true performance of the element as a part of the TA.

AB - A transmitarray (TA)-characterization method utilizing selective element illumination (SEI) using a metallic mask to isolate individual elements is described. This method allows for the effective turning off of all other elements while having minimal effect on the illumination of the desired element. The impact of the mask is analyzed through the electric fields on the aperture of the TA and the measured radiation patterns with and without the mask present. Compared to other element-isolation methods, using a mask preserves more detail in the embedded element pattern (EEP), better representing the true performance of the element as a part of the TA.

KW - Antenna arrays

KW - antenna diagnostics

KW - antenna measurements

KW - transmitarrays

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DO - 10.23919/EuCAP63536.2025.10999794

M3 - Conference article in proceedings

AN - SCOPUS:105007509012

BT - EuCAP 2025 - 19th European Conference on Antennas and Propagation

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 19th European Conference on Antennas and Propagation, EuCAP 2025

Y2 - 30 March 2025 through 4 April 2025

ER -

E-band Active Transmitarray Characterization Using Selective Element Illumination

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RF SAMPO

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E-band Active Transmitarray Characterization Using Selective Element Illumination

Abstract

Conference

Funding

Keywords

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RF SAMPO

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