Edgeless planar semiconductor sensors for a Medipix3-based radiography detector

M.J. Bosma, E. Heijne, Juha Kalliopuska, J. Visser, N. Koffeman

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Abstract

We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.
Original languageEnglish
Article numberC11019
JournalJournal of Instrumentation
Volume6
Issue number11
DOIs
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

Fingerprint

Radiography
radiography
Semiconductors
Pixel
Pixels
Detector
Semiconductor materials
Detectors
Sensor
sensors
detectors
Sensors
Particle interactions
pixels
3D Reconstruction
Response Function
Energy
Interaction
Electrostatics
High Energy

Keywords

  • Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)
  • hybeid detectors
  • particle tracking detectors (Solid-state detectors)
  • X-ray radiography and digital radiography (DR)

Cite this

Bosma, M.J. ; Heijne, E. ; Kalliopuska, Juha ; Visser, J. ; Koffeman, N. / Edgeless planar semiconductor sensors for a Medipix3-based radiography detector. In: Journal of Instrumentation. 2011 ; Vol. 6, No. 11.
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Edgeless planar semiconductor sensors for a Medipix3-based radiography detector. / Bosma, M.J.; Heijne, E.; Kalliopuska, Juha; Visser, J.; Koffeman, N.

In: Journal of Instrumentation, Vol. 6, No. 11, C11019, 2011.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Edgeless planar semiconductor sensors for a Medipix3-based radiography detector

AU - Bosma, M.J.

AU - Heijne, E.

AU - Kalliopuska, Juha

AU - Visser, J.

AU - Koffeman, N.

PY - 2011

Y1 - 2011

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AB - We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.

KW - Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)

KW - hybeid detectors

KW - particle tracking detectors (Solid-state detectors)

KW - X-ray radiography and digital radiography (DR)

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