Original language | English |
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Title of host publication | International Geoscience and Remote Sensing Symposium (IGARSS) |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 832-835 |
ISBN (Print) | 978-142442808-3 |
DOIs | |
Publication status | Published - 2008 |
MoE publication type | B3 Non-refereed article in conference proceedings |
Effect of burn scar pattern variability on medium resolution burnt area mapping in southeast asia
S.C. Liew, J. Miettinen
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific