Effect of burn scar pattern variability on medium resolution burnt area mapping in southeast asia

S.C. Liew, J. Miettinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

Original languageEnglish
Title of host publicationInternational Geoscience and Remote Sensing Symposium (IGARSS)
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages832-835
ISBN (Print)978-142442808-3
DOIs
Publication statusPublished - 2008
MoE publication typeB3 Non-refereed article in conference proceedings

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