Effect of burn scar pattern variability on medium resolution burnt area mapping in southeast asia

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

Original language	English
Title of host publication	International Geoscience and Remote Sensing Symposium (IGARSS)
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	832-835
ISBN (Print)	978-142442808-3
DOIs	https://doi.org/10.1109/IGARSS.2008.4779478
Publication status	Published - 2008
MoE publication type	B3 Non-refereed article in conference proceedings

Access to Document

@inproceedings{969283e28fd644f3bb6b46bc1f03cccd,

title = "Effect of burn scar pattern variability on medium resolution burnt area mapping in southeast asia",

author = "S.C. Liew and J. Miettinen",

year = "2008",

doi = "10.1109/IGARSS.2008.4779478",

language = "English",

isbn = "978-142442808-3",

pages = "832--835",

booktitle = "International Geoscience and Remote Sensing Symposium (IGARSS)",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

}

Effect of burn scar pattern variability on medium resolution burnt area mapping in southeast asia. / Liew, S.C.; Miettinen, J.
International Geoscience and Remote Sensing Symposium (IGARSS). IEEE Institute of Electrical and Electronic Engineers, 2008. p. 832-835.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

TY - GEN

T1 - Effect of burn scar pattern variability on medium resolution burnt area mapping in southeast asia

AU - Liew, S.C.

AU - Miettinen, J.

PY - 2008

Y1 - 2008

UR - https://www.scopus.com/pages/publications/67649780092

U2 - 10.1109/IGARSS.2008.4779478

DO - 10.1109/IGARSS.2008.4779478

M3 - Conference article in proceedings

SN - 978-142442808-3

SP - 832

EP - 835

BT - International Geoscience and Remote Sensing Symposium (IGARSS)

PB - IEEE Institute of Electrical and Electronic Engineers

ER -