Effect of low amount of nanosilica on dielectric properties of polypropylene

M. Takala, B. Sonerud, H. Ranta, Jani Pelto, S. Ahonen, M. Pettersson, S. Kannus

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

4 Citations (Scopus)

Abstract

This paper presents the results of the dielectric properties measurements conducted on Silica-Polypropylene (PP) nanocomposites. According to prior investigations by the authors silica nanoparticles have improved the performance of the dielectric material considering capacitor applications. Especially breakdown strengths with ac and dc voltages and resistance against surface degradation have increased. The relative permittivity and dielectric losses have also been comparable to reference PP. In this paper the results of the dielectric measurements conducted on composites with 1-2 wt-% silica are compared with reference PP. Silica dispersion in PP was confirmed with transmission electron microscopy (TEM). Weibull analysis was applied to the breakdown strength measurement results with dc voltage. Capacitance and loss factor measurements were conducted as a function of temperature to study thermal behavior. The measurements were conducted at the high voltage laboratories of Tampere University of Technology and Chalmers University of Technology. Statistical analysis was applied to the results to determine the significance of the differences between the materials. (26 refs.)
Original languageEnglish
Title of host publicationProceedings of the 10th IEEE International Conference on Solid Dielectrics, ICSD 2010
Place of PublicationPiscataway, NJ, USA
PublisherInstitute of Electrical and Electronic Engineers IEEE
Number of pages5
ISBN (Electronic)978-1-4244-7944-3
ISBN (Print)978-1-4244-7945-0
DOIs
Publication statusPublished - 2010
MoE publication typeA4 Article in a conference publication
Event10th IEEE International Conference on Solid Dielectrics, ICSD 2010 - Potsdam, Germany
Duration: 4 Jul 20109 Jul 2010

Conference

Conference10th IEEE International Conference on Solid Dielectrics, ICSD 2010
Abbreviated titleICSD 2010
CountryGermany
CityPotsdam
Period4/07/109/07/10

Fingerprint

Dielectric properties
Polypropylenes
Silica
Electric potential
Surface resistance
Dielectric losses
Nanocomposites
Statistical methods
Capacitors
Permittivity
Capacitance
Nanoparticles
Transmission electron microscopy
Degradation
Composite materials
Temperature

Cite this

Takala, M., Sonerud, B., Ranta, H., Pelto, J., Ahonen, S., Pettersson, M., & Kannus, S. (2010). Effect of low amount of nanosilica on dielectric properties of polypropylene. In Proceedings of the 10th IEEE International Conference on Solid Dielectrics, ICSD 2010 [5568095] Piscataway, NJ, USA: Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/ICSD.2010.5568095
Takala, M. ; Sonerud, B. ; Ranta, H. ; Pelto, Jani ; Ahonen, S. ; Pettersson, M. ; Kannus, S. / Effect of low amount of nanosilica on dielectric properties of polypropylene. Proceedings of the 10th IEEE International Conference on Solid Dielectrics, ICSD 2010. Piscataway, NJ, USA : Institute of Electrical and Electronic Engineers IEEE, 2010.
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abstract = "This paper presents the results of the dielectric properties measurements conducted on Silica-Polypropylene (PP) nanocomposites. According to prior investigations by the authors silica nanoparticles have improved the performance of the dielectric material considering capacitor applications. Especially breakdown strengths with ac and dc voltages and resistance against surface degradation have increased. The relative permittivity and dielectric losses have also been comparable to reference PP. In this paper the results of the dielectric measurements conducted on composites with 1-2 wt-{\%} silica are compared with reference PP. Silica dispersion in PP was confirmed with transmission electron microscopy (TEM). Weibull analysis was applied to the breakdown strength measurement results with dc voltage. Capacitance and loss factor measurements were conducted as a function of temperature to study thermal behavior. The measurements were conducted at the high voltage laboratories of Tampere University of Technology and Chalmers University of Technology. Statistical analysis was applied to the results to determine the significance of the differences between the materials. (26 refs.)",
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Takala, M, Sonerud, B, Ranta, H, Pelto, J, Ahonen, S, Pettersson, M & Kannus, S 2010, Effect of low amount of nanosilica on dielectric properties of polypropylene. in Proceedings of the 10th IEEE International Conference on Solid Dielectrics, ICSD 2010., 5568095, Institute of Electrical and Electronic Engineers IEEE, Piscataway, NJ, USA, 10th IEEE International Conference on Solid Dielectrics, ICSD 2010, Potsdam, Germany, 4/07/10. https://doi.org/10.1109/ICSD.2010.5568095

Effect of low amount of nanosilica on dielectric properties of polypropylene. / Takala, M.; Sonerud, B.; Ranta, H.; Pelto, Jani; Ahonen, S.; Pettersson, M.; Kannus, S.

Proceedings of the 10th IEEE International Conference on Solid Dielectrics, ICSD 2010. Piscataway, NJ, USA : Institute of Electrical and Electronic Engineers IEEE, 2010. 5568095.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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T1 - Effect of low amount of nanosilica on dielectric properties of polypropylene

AU - Takala, M.

AU - Sonerud, B.

AU - Ranta, H.

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AU - Ahonen, S.

AU - Pettersson, M.

AU - Kannus, S.

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N2 - This paper presents the results of the dielectric properties measurements conducted on Silica-Polypropylene (PP) nanocomposites. According to prior investigations by the authors silica nanoparticles have improved the performance of the dielectric material considering capacitor applications. Especially breakdown strengths with ac and dc voltages and resistance against surface degradation have increased. The relative permittivity and dielectric losses have also been comparable to reference PP. In this paper the results of the dielectric measurements conducted on composites with 1-2 wt-% silica are compared with reference PP. Silica dispersion in PP was confirmed with transmission electron microscopy (TEM). Weibull analysis was applied to the breakdown strength measurement results with dc voltage. Capacitance and loss factor measurements were conducted as a function of temperature to study thermal behavior. The measurements were conducted at the high voltage laboratories of Tampere University of Technology and Chalmers University of Technology. Statistical analysis was applied to the results to determine the significance of the differences between the materials. (26 refs.)

AB - This paper presents the results of the dielectric properties measurements conducted on Silica-Polypropylene (PP) nanocomposites. According to prior investigations by the authors silica nanoparticles have improved the performance of the dielectric material considering capacitor applications. Especially breakdown strengths with ac and dc voltages and resistance against surface degradation have increased. The relative permittivity and dielectric losses have also been comparable to reference PP. In this paper the results of the dielectric measurements conducted on composites with 1-2 wt-% silica are compared with reference PP. Silica dispersion in PP was confirmed with transmission electron microscopy (TEM). Weibull analysis was applied to the breakdown strength measurement results with dc voltage. Capacitance and loss factor measurements were conducted as a function of temperature to study thermal behavior. The measurements were conducted at the high voltage laboratories of Tampere University of Technology and Chalmers University of Technology. Statistical analysis was applied to the results to determine the significance of the differences between the materials. (26 refs.)

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BT - Proceedings of the 10th IEEE International Conference on Solid Dielectrics, ICSD 2010

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Takala M, Sonerud B, Ranta H, Pelto J, Ahonen S, Pettersson M et al. Effect of low amount of nanosilica on dielectric properties of polypropylene. In Proceedings of the 10th IEEE International Conference on Solid Dielectrics, ICSD 2010. Piscataway, NJ, USA: Institute of Electrical and Electronic Engineers IEEE. 2010. 5568095 https://doi.org/10.1109/ICSD.2010.5568095