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Effect of Oxygen on the reactions in the Si/Ta/Cu metallization system
Tomi Laurila
, Kejun Zeng
, Jorma Kivilahti
, Jyrki Molarius
, Ilkka Suni
VTT Technical Research Centre of Finland
Helsinki University of Technology
VTT (former employee or external)
Research output
:
Contribution to journal
›
Article
›
Scientific
›
peer-review
29
Citations (Scopus)
Overview
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Keyphrases
Barrier Layer
100%
Binary System
50%
Combined Transmission
50%
Cu Diffusion
50%
Cu Metallization
100%
Dissolution Reaction
50%
Electron Energy
50%
Energy Dispersive X-ray Spectroscopy
50%
Interfacial Oxide
100%
Ion Signal
50%
Kinetically Controlled
50%
Metallization System
100%
Molecular Ions
50%
Oxide Dissolution
50%
Oxygen Effect
100%
Oxygen Solubility
50%
Reaction Mechanism
50%
Secondary Ion Mass Spectrometry
50%
Tantalum Oxide
100%
Temperature Range
100%
Threshold Temperature
50%
Transmission Electron Microscopy
50%
INIS
barrier layer
50%
bcc lattices
25%
diffusion
50%
dissolution
75%
energy
25%
films
25%
interfaces
25%
ions
25%
kinetics
25%
layers
75%
mass spectrometry
25%
matrices
50%
molecular ions
25%
oxides
50%
oxygen
100%
reaction mechanisms
25%
signals
25%
solubility
25%
spectroscopy
25%
sputtering
25%
tantalum oxides
50%
temperature range
50%
transmission electron microscopy
25%
Engineering
Barrier Layer
100%
Dissolution Reaction
50%
Metallizations
100%
Oxygen Solubility
50%
Temperature Range
100%
Threshold Temperature
50%
Material Science
Film
50%
Oxide Compound
100%
Secondary Ion Mass Spectrometry
50%
Tantalum Oxides
100%
Transmission Electron Microscopy
50%
Chemical Engineering
Film
50%
Metallizing
100%
Secondary Ion Mass Spectrometry
50%
Food Science
Secondary Ion Mass Spectrometry
100%
Transmission Electron Microscopy
100%