Abstract
Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.
Original language | English |
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Pages (from-to) | 2600-2604 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 41 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1994 |
MoE publication type | A1 Journal article-refereed |
Event | 31st IEEE Nuclear and Space Radiation Effects Conference (NSREC '94) - Tucson, United States Duration: 18 Jun 1994 → 22 Jun 1994 |