Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.
|Journal||IEEE Transactions on Nuclear Science|
|Publication status||Published - 1994|
|MoE publication type||A1 Journal article-refereed|
|Event||31st IEEE Nuclear and Space Radiation Effects Conference (NSREC '94) - Tucson, United States|
Duration: 18 Jun 1994 → 22 Jun 1994