Effect of test method on the failure dose of SEEQ 28C256 EEPROM

Raimo Verkasalo

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)


Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.
Original languageEnglish
Pages (from-to)2600-2604
JournalIEEE Transactions on Nuclear Science
Issue number6
Publication statusPublished - 1994
MoE publication typeA1 Journal article-refereed
Event31st IEEE Nuclear and Space Radiation Effects Conference (NSREC '94) - Tucson, United States
Duration: 18 Jun 199422 Jun 1994


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