Effect of test method on the failure dose of SEEQ 28C256 EEPROM

Raimo Verkasalo

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Abstract

Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.
Original languageEnglish
Pages (from-to)2600-2604
Number of pages5
JournalIEEE Transactions on Nuclear Science
Volume41
Issue number6
DOIs
Publication statusPublished - 1994
MoE publication typeA1 Journal article-refereed

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title = "Effect of test method on the failure dose of SEEQ 28C256 EEPROM",
abstract = "Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.",
author = "Raimo Verkasalo",
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doi = "10.1109/23.340570",
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Effect of test method on the failure dose of SEEQ 28C256 EEPROM. / Verkasalo, Raimo.

In: IEEE Transactions on Nuclear Science, Vol. 41, No. 6, 1994, p. 2600-2604.

Research output: Contribution to journalArticleScientificpeer-review

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AU - Verkasalo, Raimo

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AB - Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.

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