Effect of test method on the failure dose of SEEQ 28C256 EEPROM

Raimo Verkasalo

doi:10.1109/23.340570

Effect of test method on the failure dose of SEEQ 28C256 EEPROM

Raimo Verkasalo

VTT Technical Research Centre of Finland

Research output: Contribution to journal › Article › Scientific › peer-review

4 Citations (Scopus)

Abstract

Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.

Original language	English
Pages (from-to)	2600-2604
Journal	IEEE Transactions on Nuclear Science
Volume	41
Issue number	6
DOIs	https://doi.org/10.1109/23.340570
Publication status	Published - 1994
MoE publication type	A1 Journal article-refereed
Event	31st IEEE Nuclear and Space Radiation Effects Conference (NSREC '94) - Tucson, United States Duration: 18 Jun 1994 → 22 Jun 1994

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title = "Effect of test method on the failure dose of SEEQ 28C256 EEPROM",

abstract = "Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.",

author = "Raimo Verkasalo",

note = "Project code: ele 4305 ; 31st IEEE Nuclear and Space Radiation Effects Conference (NSREC '94) ; Conference date: 18-06-1994 Through 22-06-1994",

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AB - Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependence of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.

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DO - 10.1109/23.340570

M3 - Article

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VL - 41

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JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

IS - 6

T2 - 31st IEEE Nuclear and Space Radiation Effects Conference (NSREC '94)

Y2 - 18 June 1994 through 22 June 1994

ER -

Effect of test method on the failure dose of SEEQ 28C256 EEPROM

Abstract

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