Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs

Himadri Majumdar; Jaakko Leppäniemi; Kimmo Ojanperä; Olli-Heikki Huttunen; Ari Alastalo

doi:10.1109/ESTC.2014.6962762

Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs

Himadri Majumdar, Jaakko Leppäniemi, Kimmo Ojanperä, Olli-Heikki Huttunen, Ari Alastalo

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

1 Citation (Scopus)

Abstract

This paper focuses on ultra-violet (UV)-curing of solution-processed metal-oxide (MO) semiconductors for application in thin film transistors (TFTs). The goal is to combine low-temperature thermal annealing with UV exposure and achieve printable transistors on flexible plastic substrates. In this paper we focus on the use of two different wavelengths of UV and clarify their effect on the performance of the metal-oxide semiconductors. The electrical properties of TFTs made with these semiconductors are characterized. The results show that wavelength of the UV exposure is critical for optimized performance of the semiconductor and the TFTs.

Original language	English
Title of host publication	Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014
Publisher	IEEE Institute of Electrical and Electronic Engineers
ISBN (Print)	978-1-4799-4026-4
DOIs	https://doi.org/10.1109/ESTC.2014.6962762
Publication status	Published - 2014
MoE publication type	A4 Article in a conference publication
Event	5th Electronics System-Integration Technology Conference, ESTC 2014 - Helsinki, Finland Duration: 16 Sept 2014 → 18 Sept 2014 Conference number: 5th

Conference

Conference	5th Electronics System-Integration Technology Conference, ESTC 2014
Abbreviated title	ESTC 2014
Country/Territory	Finland
City	Helsinki
Period	16/09/14 → 18/09/14

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10.1109/ESTC.2014.6962762

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Majumdar, H., Leppäniemi, J., Ojanperä, K., Huttunen, O.-H., & Alastalo, A. (2014). Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs. In Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014 IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ESTC.2014.6962762

@inproceedings{34e077d8d4ef44429522d17b441fad98,

title = "Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs",

abstract = "This paper focuses on ultra-violet (UV)-curing of solution-processed metal-oxide (MO) semiconductors for application in thin film transistors (TFTs). The goal is to combine low-temperature thermal annealing with UV exposure and achieve printable transistors on flexible plastic substrates. In this paper we focus on the use of two different wavelengths of UV and clarify their effect on the performance of the metal-oxide semiconductors. The electrical properties of TFTs made with these semiconductors are characterized. The results show that wavelength of the UV exposure is critical for optimized performance of the semiconductor and the TFTs.",

author = "Himadri Majumdar and Jaakko Lepp{\"a}niemi and Kimmo Ojanper{\"a} and Olli-Heikki Huttunen and Ari Alastalo",

year = "2014",

doi = "10.1109/ESTC.2014.6962762",

language = "English",

isbn = "978-1-4799-4026-4",

booktitle = "Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "5th Electronics System-Integration Technology Conference, ESTC 2014, ESTC 2014 ; Conference date: 16-09-2014 Through 18-09-2014",

}

Majumdar, H , Leppäniemi, J, Ojanperä, K, Huttunen, O-H & Alastalo, A 2014, Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs. in Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014. IEEE Institute of Electrical and Electronic Engineers, 5th Electronics System-Integration Technology Conference, ESTC 2014, Helsinki, Finland, 16/09/14. https://doi.org/10.1109/ESTC.2014.6962762

Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs. / Majumdar, Himadri ; Leppäniemi, Jaakko; Ojanperä, Kimmo et al.
Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014. IEEE Institute of Electrical and Electronic Engineers, 2014.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs

AU - Majumdar, Himadri

AU - Leppäniemi, Jaakko

AU - Ojanperä, Kimmo

AU - Huttunen, Olli-Heikki

AU - Alastalo, Ari

N1 - Conference code: 5th

PY - 2014

Y1 - 2014

N2 - This paper focuses on ultra-violet (UV)-curing of solution-processed metal-oxide (MO) semiconductors for application in thin film transistors (TFTs). The goal is to combine low-temperature thermal annealing with UV exposure and achieve printable transistors on flexible plastic substrates. In this paper we focus on the use of two different wavelengths of UV and clarify their effect on the performance of the metal-oxide semiconductors. The electrical properties of TFTs made with these semiconductors are characterized. The results show that wavelength of the UV exposure is critical for optimized performance of the semiconductor and the TFTs.

AB - This paper focuses on ultra-violet (UV)-curing of solution-processed metal-oxide (MO) semiconductors for application in thin film transistors (TFTs). The goal is to combine low-temperature thermal annealing with UV exposure and achieve printable transistors on flexible plastic substrates. In this paper we focus on the use of two different wavelengths of UV and clarify their effect on the performance of the metal-oxide semiconductors. The electrical properties of TFTs made with these semiconductors are characterized. The results show that wavelength of the UV exposure is critical for optimized performance of the semiconductor and the TFTs.

U2 - 10.1109/ESTC.2014.6962762

DO - 10.1109/ESTC.2014.6962762

M3 - Conference article in proceedings

SN - 978-1-4799-4026-4

BT - Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 5th Electronics System-Integration Technology Conference, ESTC 2014

Y2 - 16 September 2014 through 18 September 2014

ER -

Effect of UV light and low temperature on solution-processed, high-performance metal-oxide semiconductors and TFTs

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