Effects of thermal aging on the characteristic breakdown behavior of nano-SiO2-BOPP and BOPP films

Mikael Ritamäki, Ilkka Rytöluoto, Kari Lahti, Mikko Karttunen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

4 Citations (Scopus)

Abstract

The effects of thermal stress on the breakdown behavior of biaxially oriented PP-silica nanocomposite thin film and commercial BOPP film was evaluated with a step stress experiment in the temperature range of 50...110 °C. Weak spots were measured in thermally aged un-filled BOPP films but not in the PP-silica, which in turn displayed increasing scatter of the breakdown voltages and the scattering seemingly settled to a certain level. No weak spots were measured in un-filled BOPP films removed after highest temperatures. The behavior of un-filled films is speculated to result from either actual polymer aging in addition to the statistical nature of breakdown phenomena or from thermally-activated processes possibly involving antioxidants. The different behavior in the nanocomposite was speculated to result from polymer-nanoparticle interactions possibly countering the effects of antioxidants and hindering weak spot formation. The results demonstrate the different behavior of polymer-nanocomposites and traditional BOPP films under thermal stress and highlight the importance of evaluating the aging behavior of new materials.
Original languageEnglish
Title of host publicationProperties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pages400-403
ISBN (Electronic)978-1-4799-8903-4, 978-1-4799-8902-7
DOIs
Publication statusPublished - 15 Oct 2015
MoE publication typeA4 Article in a conference publication
EventIEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 - Sydney, Australia
Duration: 19 Jul 201522 Jul 2015
Conference number: 11

Publication series

Name
ISSN (Print)2160-9225
ISSN (Electronic)2160-9241

Conference

ConferenceIEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015
Abbreviated titleICPADM 2015
CountryAustralia
CitySydney
Period19/07/1522/07/15

Fingerprint

breakdown
nanocomposites
antioxidants
thermal stresses
polymers
silicon dioxide
electrical faults
nanoparticles
thin films
scattering
interactions
temperature

Keywords

  • BOPP film
  • thermal stress
  • breakdown

Cite this

Ritamäki, M., Rytöluoto, I., Lahti, K., & Karttunen, M. (2015). Effects of thermal aging on the characteristic breakdown behavior of nano-SiO2-BOPP and BOPP films. In Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the (pp. 400-403). Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/ICPADM.2015.7295293
Ritamäki, Mikael ; Rytöluoto, Ilkka ; Lahti, Kari ; Karttunen, Mikko. / Effects of thermal aging on the characteristic breakdown behavior of nano-SiO2-BOPP and BOPP films. Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the. Institute of Electrical and Electronic Engineers IEEE, 2015. pp. 400-403
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Ritamäki, M, Rytöluoto, I, Lahti, K & Karttunen, M 2015, Effects of thermal aging on the characteristic breakdown behavior of nano-SiO2-BOPP and BOPP films. in Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the. Institute of Electrical and Electronic Engineers IEEE, pp. 400-403, IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015, Sydney, Australia, 19/07/15. https://doi.org/10.1109/ICPADM.2015.7295293

Effects of thermal aging on the characteristic breakdown behavior of nano-SiO2-BOPP and BOPP films. / Ritamäki, Mikael; Rytöluoto, Ilkka; Lahti, Kari; Karttunen, Mikko.

Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the. Institute of Electrical and Electronic Engineers IEEE, 2015. p. 400-403.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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AU - Karttunen, Mikko

PY - 2015/10/15

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Ritamäki M, Rytöluoto I, Lahti K, Karttunen M. Effects of thermal aging on the characteristic breakdown behavior of nano-SiO2-BOPP and BOPP films. In Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the. Institute of Electrical and Electronic Engineers IEEE. 2015. p. 400-403 https://doi.org/10.1109/ICPADM.2015.7295293