Abstract
The effects of thermal stress on the breakdown behavior of biaxially oriented PP-silica nanocomposite thin film and commercial BOPP film was evaluated with a step stress experiment in the temperature range of 50...110 °C. Weak spots were measured in thermally aged un-filled BOPP films but not in the PP-silica, which in turn displayed increasing scatter of the breakdown voltages and the scattering seemingly settled to a certain level. No weak spots were measured in un-filled BOPP films removed after highest temperatures. The behavior of un-filled films is speculated to result from either actual polymer aging in addition to the statistical nature of breakdown phenomena or from thermally-activated processes possibly involving antioxidants. The different behavior in the nanocomposite was speculated to result from polymer-nanoparticle interactions possibly countering the effects of antioxidants and hindering weak spot formation. The results demonstrate the different behavior of polymer-nanocomposites and traditional BOPP films under thermal stress and highlight the importance of evaluating the aging behavior of new materials.
Original language | English |
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Title of host publication | Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 400-403 |
ISBN (Electronic) | 978-1-4799-8903-4, 978-1-4799-8902-7 |
DOIs | |
Publication status | Published - 15 Oct 2015 |
MoE publication type | A4 Article in a conference publication |
Event | IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 - Sydney, Australia Duration: 19 Jul 2015 → 22 Jul 2015 Conference number: 11 |
Conference
Conference | IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 |
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Abbreviated title | ICPADM 2015 |
Country/Territory | Australia |
City | Sydney |
Period | 19/07/15 → 22/07/15 |
Keywords
- BOPP film
- thermal stress
- breakdown