Electrical double-layer capacitors: Evaluation of ageing phenomena during cycle life testing

N. Omar (Corresponding Author), H. Gualous, Justin Salminen, G. Mulder, A. Samba, Y. Firouz, M.A. Monem, P. Van den Bossche, J. Van Mierlo

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Abstract

This paper represents an assessment of the main ageing phenomena in electrical double-layer capacitors (EDLCs). In this study the cycle life of the EDLC cells with a rated capacitance of 1,600 F has been investigated at different ambient temperatures and current rates. From the experimental results we can observe that the impact of the high ambient temperature is significant on the cycle life of the cells. Moreover, the results also show the negative impact of the current rate. The internal resistance tests showed that the increase of the resistance is much higher than the decrease of the capacitance. Thus, the ageing of the EDLC during cycling was clearly non-linear. Further the EIS measurements indicated the higher increase of the imaginary part of the impedance at low frequencies during cycling, which indicates the capacitance fade.
Original languageEnglish
Pages (from-to)509-522
Number of pages13
JournalJournal of Applied Electrochemistry
Volume44
Issue number4
DOIs
Publication statusPublished - 2014
MoE publication typeA1 Journal article-refereed

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Keywords

  • ageing
  • capacitance fade
  • EIS
  • electrical double-layer capacitors
  • internal resistance increase
  • lifetime model

Cite this

Omar, N., Gualous, H., Salminen, J., Mulder, G., Samba, A., Firouz, Y., Monem, M. A., Van den Bossche, P., & Van Mierlo, J. (2014). Electrical double-layer capacitors: Evaluation of ageing phenomena during cycle life testing. Journal of Applied Electrochemistry, 44(4), 509-522. https://doi.org/10.1007/s10800-013-0640-4