Electrical properties of oxide films formed on copper in 0.1 M borax solution

Juha Piippo, Timo Saario, Timo Laitinen

Research output: Book/ReportReportProfessional

Original languageEnglish
Place of PublicationHelsinki
PublisherRadiation and Nuclear Safety Authority STUK
Number of pages45
ISBN (Print)951-712-129-6
Publication statusPublished - 1996
MoE publication typeNot Eligible

Publication series

NameSTUK-YTO-TR
PublisherRadiation and Nuclear Safety Authority
No.106
ISSN (Print)0785-9325

Keywords

  • copper
  • oxide
  • electrical properties
  • corrosion

Cite this

Piippo, J., Saario, T., & Laitinen, T. (1996). Electrical properties of oxide films formed on copper in 0.1 M borax solution. Helsinki: Radiation and Nuclear Safety Authority STUK. STUK-YTO-TR, No. 106
Piippo, Juha ; Saario, Timo ; Laitinen, Timo. / Electrical properties of oxide films formed on copper in 0.1 M borax solution. Helsinki : Radiation and Nuclear Safety Authority STUK, 1996. 45 p. (STUK-YTO-TR; No. 106).
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Piippo, J, Saario, T & Laitinen, T 1996, Electrical properties of oxide films formed on copper in 0.1 M borax solution. STUK-YTO-TR, no. 106, Radiation and Nuclear Safety Authority STUK, Helsinki.

Electrical properties of oxide films formed on copper in 0.1 M borax solution. / Piippo, Juha; Saario, Timo; Laitinen, Timo.

Helsinki : Radiation and Nuclear Safety Authority STUK, 1996. 45 p. (STUK-YTO-TR; No. 106).

Research output: Book/ReportReportProfessional

TY - BOOK

T1 - Electrical properties of oxide films formed on copper in 0.1 M borax solution

AU - Piippo, Juha

AU - Saario, Timo

AU - Laitinen, Timo

PY - 1996

Y1 - 1996

KW - copper

KW - oxide

KW - electrical properties

KW - corrosion

M3 - Report

SN - 951-712-129-6

T3 - STUK-YTO-TR

BT - Electrical properties of oxide films formed on copper in 0.1 M borax solution

PB - Radiation and Nuclear Safety Authority STUK

CY - Helsinki

ER -

Piippo J, Saario T, Laitinen T. Electrical properties of oxide films formed on copper in 0.1 M borax solution. Helsinki: Radiation and Nuclear Safety Authority STUK, 1996. 45 p. (STUK-YTO-TR; No. 106).