Electrically tuneable NIR-spectrometer

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationMicro-optical Technologies for Measurement, Sensors, and Microsystems II
PublisherInternational Society for Optics and Photonics SPIE
DOIs
Publication statusPublished - 1997
MoE publication typeA4 Article in a conference publication
EventEuropean Symposium on Lasers and Optics in Manufacturing: Conference on Micro-Optical Technologies for Measurement, Sensors, and Microsystems II - Fairgrounds, Munich, Germany
Duration: 16 Jun 199720 Jun 1997

Publication series

SeriesProceedings of SPIE
Volume3099

Conference

ConferenceEuropean Symposium on Lasers and Optics in Manufacturing
CountryGermany
CityMunich
Period16/06/9720/06/97

Cite this

Keränen, K., Karioja, P., Rusanen, O., Tenhunen, J., Blomberg, M., & Lehto, A. (1997). Electrically tuneable NIR-spectrometer. In Micro-optical Technologies for Measurement, Sensors, and Microsystems II [22] International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 3099 https://doi.org/10.1117/12.281225
Keränen, Kimmo ; Karioja, Pentti ; Rusanen, Outi ; Tenhunen, Jussi ; Blomberg, Martti ; Lehto, Ari. / Electrically tuneable NIR-spectrometer. Micro-optical Technologies for Measurement, Sensors, and Microsystems II . International Society for Optics and Photonics SPIE, 1997. (Proceedings of SPIE, Vol. 3099).
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title = "Electrically tuneable NIR-spectrometer",
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year = "1997",
doi = "10.1117/12.281225",
language = "English",
series = "Proceedings of SPIE",
publisher = "International Society for Optics and Photonics SPIE",
booktitle = "Micro-optical Technologies for Measurement, Sensors, and Microsystems II",
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Keränen, K, Karioja, P, Rusanen, O, Tenhunen, J, Blomberg, M & Lehto, A 1997, Electrically tuneable NIR-spectrometer. in Micro-optical Technologies for Measurement, Sensors, and Microsystems II ., 22, International Society for Optics and Photonics SPIE, Proceedings of SPIE, vol. 3099, European Symposium on Lasers and Optics in Manufacturing, Munich, Germany, 16/06/97. https://doi.org/10.1117/12.281225

Electrically tuneable NIR-spectrometer. / Keränen, Kimmo; Karioja, Pentti; Rusanen, Outi; Tenhunen, Jussi; Blomberg, Martti; Lehto, Ari.

Micro-optical Technologies for Measurement, Sensors, and Microsystems II . International Society for Optics and Photonics SPIE, 1997. 22 (Proceedings of SPIE, Vol. 3099).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

TY - GEN

T1 - Electrically tuneable NIR-spectrometer

AU - Keränen, Kimmo

AU - Karioja, Pentti

AU - Rusanen, Outi

AU - Tenhunen, Jussi

AU - Blomberg, Martti

AU - Lehto, Ari

PY - 1997

Y1 - 1997

U2 - 10.1117/12.281225

DO - 10.1117/12.281225

M3 - Conference article in proceedings

T3 - Proceedings of SPIE

BT - Micro-optical Technologies for Measurement, Sensors, and Microsystems II

PB - International Society for Optics and Photonics SPIE

ER -

Keränen K, Karioja P, Rusanen O, Tenhunen J, Blomberg M, Lehto A. Electrically tuneable NIR-spectrometer. In Micro-optical Technologies for Measurement, Sensors, and Microsystems II . International Society for Optics and Photonics SPIE. 1997. 22. (Proceedings of SPIE, Vol. 3099). https://doi.org/10.1117/12.281225