@inbook{46759b15144c4c1ebec5a411a620a0df,
title = "Electromigration resistance of multilayer aluminum/titanium interconnects",
author = "Manuela Finetti and Hannu Ronkainen and Martti Blomberg and Ilkka Suni",
note = "LIS: A3 CA: PUO",
year = "1986",
language = "English",
isbn = "978-1-1074-0574-5",
series = "Materials Research Society Symposia Proceedings",
publisher = "Cambridge University Press",
pages = "811--816",
editor = "R.J. Nemanich and P.S. Ho and S.S. Lau",
booktitle = "Thin films",
address = "United Kingdom",
}