Electron‐beam‐induced structural phase transition related to oxygen vacancy ordering in epitaxial La2/3Sr1/3MnO3 films

Lide Yao, Sayani Majumdar, Laura Akaslompolo, Sampo Inkinen, Qihang Qin, Sebastiaan van Dijken

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Scientific

Original language	English
Title of host publication	European Microscopy Congress 2016: Proceedings
Publisher	Wiley
Number of pages	2
ISBN (Print)	978-3-5273-4297-6
DOIs	https://doi.org/10.1002/9783527808465.EMC2016.5850
Publication status	Published - 2016
MoE publication type	Not Eligible
Event	European Microscopy Congress 2016 - Lyon, France Duration: 28 Aug 2016 → 2 Sep 2016

Conference	European Microscopy Congress 2016
Country	France
City	Lyon
Period	28/08/16 → 2/09/16

Cite this

@inbook{157c97e62f9d495b92197a643f0141a2,

title = "Electron‐beam‐induced structural phase transition related to oxygen vacancy ordering in epitaxial La2/3Sr1/3MnO3 films",

author = "Lide Yao and Sayani Majumdar and Laura Akaslompolo and Sampo Inkinen and Qihang Qin and {van Dijken}, Sebastiaan",

year = "2016",

doi = "10.1002/9783527808465.EMC2016.5850",

language = "English",

isbn = "978-3-5273-4297-6",

booktitle = "European Microscopy Congress 2016: Proceedings",

publisher = "Wiley",

address = "United States",

note = "European Microscopy Congress 2016 ; Conference date: 28-08-2016 Through 02-09-2016",

}

European Microscopy Congress 2016: Proceedings. Wiley, 2016.

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Scientific

TY - CHAP

T1 - Electron‐beam‐induced structural phase transition related to oxygen vacancy ordering in epitaxial La2/3Sr1/3MnO3 films

AU - Yao, Lide

AU - Majumdar, Sayani

AU - Akaslompolo, Laura

AU - Inkinen, Sampo

AU - Qin, Qihang

AU - van Dijken, Sebastiaan

PY - 2016

Y1 - 2016

U2 - 10.1002/9783527808465.EMC2016.5850

DO - 10.1002/9783527808465.EMC2016.5850

M3 - Conference abstract in proceedings

SN - 978-3-5273-4297-6

BT - European Microscopy Congress 2016: Proceedings

PB - Wiley

T2 - European Microscopy Congress 2016

Y2 - 28 August 2016 through 2 September 2016

ER -