Electronic and structural properties of the InP(1 0 0)(2 × 4) surface studied by core-level photoemission and scanning tunneling microscopy

Pasi Laukkanen; Janne Pakarinen; M. Ahola-Tuomi; M. Kuzmin; R. E. Perälä; I. J. Väyrynen; A. Tukiainen; V. Rimpiläinen; M. Pessa; M. Adell; J. Sadowski

doi:10.1016/j.susc.2006.05.021

Electronic and structural properties of the InP(1 0 0)(2 × 4) surface studied by core-level photoemission and scanning tunneling microscopy

Pasi Laukkanen^*
, Janne Pakarinen
, M. Ahola-Tuomi
, M. Kuzmin
, R. E. Perälä
, I. J. Väyrynen
, A. Tukiainen
, V. Rimpiläinen
, M. Pessa
, M. Adell
, J. Sadowski

^*Corresponding author for this work

Not published at VTT

Research output: Contribution to journal › Article › Scientific › peer-review

6 Citations (Scopus)

Abstract

The (2 × 4)-reconstructed InP(1 0 0) surfaces have been investigated by scanning tunneling microscopy (STM) and synchrotron-radiation core-level photoelectron spectroscopy. STM observations show that the α2 model describes the atomic structure of the InP(1 0 0)(2 × 4) surface in a limited range of the surface-preparation conditions, as predicted theoretically but not previously observed. STM results also support the accuracy of the previously found mixed-dimer structure for the InP(1 0 0)(2 × 4) surface under less P-rich conditions. A study of P 2p core-level photoelectron spectra, measured with different surface-sensitivity conditions, demonstrates that P 2p photoemission from the mixed-dimer InP(1 0 0)(2 × 4) surface consists of at least two surface-core-level-shift (SCLS) components which have kinetic energies approximately 0.4 eV higher and 0.3 eV lower than the bulk emission. On the basis of the surface-sensitivity difference between these SCLSs, they are related to the third-layer and top-layer P sites in the mixed-dimer structure, respectively.

Original language	English
Pages (from-to)	3022-3027
Journal	Surface Science
Volume	600
Issue number	15
DOIs	https://doi.org/10.1016/j.susc.2006.05.021
Publication status	Published - 1 Aug 2006
MoE publication type	A1 Journal article-refereed

Funding

This work has been supported in part by the Academy of Finland Grant No. 205766 (I. J. V.) and by TEKES within Project No. 40126/05. Four of us would like to acknowledge financial support by the EC Access to Research Infrastructure Program (ARI).

Keywords

Indium phosphide (InP)
Scanning tunneling microscopy (STM)
Single crystal surfaces
Surface reconstruction
Synchrotron radiation photoelectron spectroscopy

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10.1016/j.susc.2006.05.021

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Laukkanen, P., Pakarinen, J., Ahola-Tuomi, M., Kuzmin, M., Perälä, R. E., Väyrynen, I. J., Tukiainen, A., Rimpiläinen, V., Pessa, M., Adell, M., & Sadowski, J. (2006). Electronic and structural properties of the InP(1 0 0)(2 × 4) surface studied by core-level photoemission and scanning tunneling microscopy. Surface Science, 600(15), 3022-3027. https://doi.org/10.1016/j.susc.2006.05.021

@article{f089942ca1d041c8bb10deb19501e377,

title = "Electronic and structural properties of the InP(1 0 0)(2 × 4) surface studied by core-level photoemission and scanning tunneling microscopy",

abstract = "The (2 × 4)-reconstructed InP(1 0 0) surfaces have been investigated by scanning tunneling microscopy (STM) and synchrotron-radiation core-level photoelectron spectroscopy. STM observations show that the α2 model describes the atomic structure of the InP(1 0 0)(2 × 4) surface in a limited range of the surface-preparation conditions, as predicted theoretically but not previously observed. STM results also support the accuracy of the previously found mixed-dimer structure for the InP(1 0 0)(2 × 4) surface under less P-rich conditions. A study of P 2p core-level photoelectron spectra, measured with different surface-sensitivity conditions, demonstrates that P 2p photoemission from the mixed-dimer InP(1 0 0)(2 × 4) surface consists of at least two surface-core-level-shift (SCLS) components which have kinetic energies approximately 0.4 eV higher and 0.3 eV lower than the bulk emission. On the basis of the surface-sensitivity difference between these SCLSs, they are related to the third-layer and top-layer P sites in the mixed-dimer structure, respectively.",

keywords = "Indium phosphide (InP), Scanning tunneling microscopy (STM), Single crystal surfaces, Surface reconstruction, Synchrotron radiation photoelectron spectroscopy",

author = "Pasi Laukkanen and Janne Pakarinen and M. Ahola-Tuomi and M. Kuzmin and Per{\"a}l{\"a}, \{R. E.\} and V{\"a}yrynen, \{I. J.\} and A. Tukiainen and V. Rimpil{\"a}inen and M. Pessa and M. Adell and J. Sadowski",

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doi = "10.1016/j.susc.2006.05.021",

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Laukkanen, P, Pakarinen, J, Ahola-Tuomi, M, Kuzmin, M, Perälä, RE, Väyrynen, IJ, Tukiainen, A, Rimpiläinen, V, Pessa, M, Adell, M & Sadowski, J 2006, 'Electronic and structural properties of the InP(1 0 0)(2 × 4) surface studied by core-level photoemission and scanning tunneling microscopy', Surface Science, vol. 600, no. 15, pp. 3022-3027. https://doi.org/10.1016/j.susc.2006.05.021

TY - JOUR

T1 - Electronic and structural properties of the InP(1 0 0)(2 × 4) surface studied by core-level photoemission and scanning tunneling microscopy

AU - Laukkanen, Pasi

AU - Pakarinen, Janne

AU - Ahola-Tuomi, M.

AU - Kuzmin, M.

AU - Perälä, R. E.

AU - Väyrynen, I. J.

AU - Tukiainen, A.

AU - Rimpiläinen, V.

AU - Pessa, M.

AU - Adell, M.

AU - Sadowski, J.

PY - 2006/8/1

Y1 - 2006/8/1

N2 - The (2 × 4)-reconstructed InP(1 0 0) surfaces have been investigated by scanning tunneling microscopy (STM) and synchrotron-radiation core-level photoelectron spectroscopy. STM observations show that the α2 model describes the atomic structure of the InP(1 0 0)(2 × 4) surface in a limited range of the surface-preparation conditions, as predicted theoretically but not previously observed. STM results also support the accuracy of the previously found mixed-dimer structure for the InP(1 0 0)(2 × 4) surface under less P-rich conditions. A study of P 2p core-level photoelectron spectra, measured with different surface-sensitivity conditions, demonstrates that P 2p photoemission from the mixed-dimer InP(1 0 0)(2 × 4) surface consists of at least two surface-core-level-shift (SCLS) components which have kinetic energies approximately 0.4 eV higher and 0.3 eV lower than the bulk emission. On the basis of the surface-sensitivity difference between these SCLSs, they are related to the third-layer and top-layer P sites in the mixed-dimer structure, respectively.

AB - The (2 × 4)-reconstructed InP(1 0 0) surfaces have been investigated by scanning tunneling microscopy (STM) and synchrotron-radiation core-level photoelectron spectroscopy. STM observations show that the α2 model describes the atomic structure of the InP(1 0 0)(2 × 4) surface in a limited range of the surface-preparation conditions, as predicted theoretically but not previously observed. STM results also support the accuracy of the previously found mixed-dimer structure for the InP(1 0 0)(2 × 4) surface under less P-rich conditions. A study of P 2p core-level photoelectron spectra, measured with different surface-sensitivity conditions, demonstrates that P 2p photoemission from the mixed-dimer InP(1 0 0)(2 × 4) surface consists of at least two surface-core-level-shift (SCLS) components which have kinetic energies approximately 0.4 eV higher and 0.3 eV lower than the bulk emission. On the basis of the surface-sensitivity difference between these SCLSs, they are related to the third-layer and top-layer P sites in the mixed-dimer structure, respectively.

KW - Indium phosphide (InP)

KW - Scanning tunneling microscopy (STM)

KW - Single crystal surfaces

KW - Surface reconstruction

KW - Synchrotron radiation photoelectron spectroscopy

UR - https://www.scopus.com/pages/publications/33746024389

U2 - 10.1016/j.susc.2006.05.021

DO - 10.1016/j.susc.2006.05.021

M3 - Article

AN - SCOPUS:33746024389

SN - 0039-6028

VL - 600

SP - 3022

EP - 3027

JO - Surface Science

JF - Surface Science

IS - 15

ER -

Electronic and structural properties of the InP(1 0 0)(2 × 4) surface studied by core-level photoemission and scanning tunneling microscopy

Abstract

Funding

Keywords

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