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Electronic transport measurements and Raman spectroscopy on carbon nanotube devices

  • Olli Herranen*
  • , Jyri Rintala
  • , Andreas Johansson
  • , Paula Queipo
  • , Albert G. Nasibulin
  • , Esko I. Kauppinen
  • , Mika Pettersson
  • , Markus Ahlskog
  • *Corresponding author for this work
  • University of Jyväskylä
  • Helsinki University of Technology
  • VTT (former employee or external)

Research output: Contribution to journalArticleScientificpeer-review

Abstract

An individual single wall carbon nanotube (SWCNT) device has been fabricated and measured using both low temperature transport and Raman measurements. With these mutually independent methods we can study the correlation between the techniques on semiconducting or metallic behavior of the tube. Furthermore, we study the structure of the nanotube by probing Raman measurements at different spots along the tube axis.
Original languageEnglish
Pages (from-to)2853-2856
JournalPhysica Status Solidi B: Basic Research
Volume246
Issue number11-12
DOIs
Publication statusPublished - 2009
MoE publication typeA1 Journal article-refereed

Keywords

  • 73.22.-f
  • 73.63.-b
  • 78.30.Na
  • 78.67.Ch
  • 81.07.De
  • 85.35.Kt

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