ePIXfab: The silicon photonics platform

A. Khanna, Y. Drissi, P. Dumon, R. Baets, P. Absil, J. Pozo, D.M.R. Lo Cascio, M. Fournier, J.-M. Fedeli, L. Fulbert, L. Zimmermann, B. Tillack, Timo Aalto, P. O'Brien, D. Deptuck, J. Xu, D. Gale

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    7 Citations (Scopus)


    ePIXfab-The European Silicon Photonics Support Center continues to provide state-of-the-art silicon photonics solutions to academia and industry for prototyping and research. ePIXfab is a consortium of EU research centers providing diverse expertise in the silicon photonics food chain, from training users in designing silicon photonics chips to fiber pigtailed chips. While ePIXfab provides world-wide users access to advanced silicon photonics it also focuses its attention to expanding the silicon photonics infrastructure through a network of design houses, access partners and industrial collaborations.
    Original languageEnglish
    Title of host publicationIntegrated Photonics
    Subtitle of host publicationMaterials, Devices, and Applications II
    EditorsJean-Marc Fedeli, Laurent Vivien, Meint K. Smit
    PublisherInternational Society for Optics and Photonics SPIE
    ISBN (Print)978-0-8194-9564-8
    Publication statusPublished - 2013
    MoE publication typeA4 Article in a conference publication
    EventSPIE Microtechnologies, 2013 - Grenoble, France
    Duration: 24 Apr 201326 Apr 2013

    Publication series

    SeriesProceedings of SPIE


    ConferenceSPIE Microtechnologies, 2013

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  • Cite this

    Khanna, A., Drissi, Y., Dumon, P., Baets, R., Absil, P., Pozo, J., Lo Cascio, D. M. R., Fournier, M., Fedeli, J-M., Fulbert, L., Zimmermann, L., Tillack, B., Aalto, T., O'Brien, P., Deptuck, D., Xu, J., & Gale, D. (2013). ePIXfab: The silicon photonics platform. In J-M. Fedeli, L. Vivien, & M. K. Smit (Eds.), Integrated Photonics: Materials, Devices, and Applications II [87670H] International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 8767 https://doi.org/10.1117/12.2020576