A system is described to measure the periodic time domain voltages and currents of a nonlinear microwave device. A vector error correction algorithm is used to take into account and correct the errors caused by imperfect microwave hardware. The system can also be used to yield frequency domain quantities such as the fundamental frequency reflection coefficient. Measurement results for two microwave transistors are given.
|Title of host publication||1988 18th European Microwave Conference|
|Place of Publication||Stockholm|
|Publisher||IEEE Institute of Electrical and Electronic Engineers|
|Publication status||Published - 1988|
|MoE publication type||A4 Article in a conference publication|